Characterization of uniaxial crystals through the study of fringe patterns
Creators
- 1. GLOmAe, Departamento de Fisica, Facultad de Ingenieria, Universidad de Buenos Aires (Argentina)
Description
The fringe pattern obtained when a divergent (or convergent) beam goes through a sample of birefringent crystal between two polarizers contains information which is inherent of the crystalline sample under study. On the other hand, by considering the design details of the experience and the parameters that are characteristic of the uniaxial plate, it is possible to theoretically obtain the luminous intensity corresponding to each point on a screen or CCD. Thus, this theoretical model allows us to obtain, from images experimentally obtained and theoretical expressions, the parameters that are characteristic of the plates. The results obtained proved the concordance between theory and experience while endorsing this technique for the characterization of birrefringent crystals and devices based on this type of materials.
Availability note (English)
Available from http://dx.doi.org/10.1088/1742-6596/274/1/012030Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Conference Series (Online)
- Journal Volume
- 274
- Journal Issue
- 1
- Journal Page Range
- [6 p.]
- ISSN
- 1742-6596
Conference
- Title
- 17. annual Ibero-American conference on optics (RIAO); 10. Latin American meeting on optics, lasers and applications (OPTILAS)
- Dates
- 20-24 Sep 2010
- Place
- Lima (Peru)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43047067
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BEAMS; CHARGE-COUPLED DEVICES; CRYSTALS; IMAGES; PLATES
- Descriptors DEC
- SEMICONDUCTOR DEVICES