Published July 2005 | Version v1
Journal article Metadata-only

Temperature-dependent EUV spectra of xenon plasmas observed in the compact helical system

Creators

  • 1. National Inst. for Fusion Science, Toki, Gifu (Japan)
  • 2. Osaka Univ., Inst. of Laser Engineering, Suita, Osaka (Japan)

Description

We carried out spectroscopic measurements of extreme ultraviolet (EUV) emissions from xenon (Xe) plasmas generated in the Compact Helical System (CHS) by a grazing incidence spectrometer with a spectral resolution of 0.05 nm. Spatial profiles of the electron density and temperature of the plasmas have been measured by laser Thomson scattering diagnostic system. A remarkable variation in spectral features by different electron temperatures was observed, and was attributed to the difference in dominant charge states of Xe ions in the plasma. (author)

Additional details

Publishing Information

Journal Title
Purazuma, Kaku Yugo Gakkai-Shi
Journal Volume
81
Journal Issue
7
Journal Page Range
p. 480-481
ISSN
0918-7928

INIS

Country of Publication
Japan
Country of Input or Organization
Japan
INIS RN
36108387
Subject category
S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
Descriptors DEI
CHARGE-COUPLED DEVICES; CHS TORSATRON; ECR HEATING; ELECTRON DENSITY; ELECTRON TEMPERATURE; ENERGY-LEVEL TRANSITIONS; EXTREME ULTRAVIOLET RADIATION; EXTREME ULTRAVIOLET SPECTRA; GRAZING INCIDENCE TOMOGRAPHY; LASER SPECTROSCOPY; PLASMA; SPATIAL DISTRIBUTION; THOMSON SCATTERING; XENON
Descriptors DEC
CLOSED PLASMA DEVICES; DIAGNOSTIC TECHNIQUES; DISTRIBUTION; ELECTROMAGNETIC RADIATION; ELEMENTS; FLUIDS; GASES; HEATING; HIGH-FREQUENCY HEATING; INELASTIC SCATTERING; NONMETALS; PLASMA HEATING; RADIATIONS; RARE GASES; SCATTERING; SEMICONDUCTOR DEVICES; SPECTRA; SPECTROSCOPY; STELLARATORS; THERMONUCLEAR DEVICES; TOMOGRAPHY; TORSATRON STELLARATORS; ULTRAVIOLET RADIATION; ULTRAVIOLET SPECTRA

Optional Information

Notes
8 refs., 2 figs.