Projectile charge state dependence of M-shell ionization of Au, Pb, Bi and U by 1.42-MeV/amu fluorine ions
Creators
- 1. North Tex State Univ, Denton
Description
This study was undertaken to determine the direct ionization and electron capture contributions to vacancy production in the M-shells of /sub 79/Au, /sub 82/Pb, /sub 83/Bi and /sub 92/U for incident /sup 19//sub 9/F ions. M-shell x-ray production cross sections have been measured for 1.42-Mev/amu /sup 19//sub 9/F/sup q+/ ions for q.4,5,6,8,9. Enhancements in the target x-ray production cross sections were observed for projectiles with one and two K-shell vacancies over those without K-shell vacancies. Direct ionization and electron capture contributions to the vacancy production were extracted from the data and compared to the plane wave Born approximation and to the J.R. Oppenheimer-H.C. Brinkman-H.A. Kramers, calculations of V.S. Nikolaev, respectively. 20 refs
Additional details
Publishing Information
- Journal Title
- IEEE Trans. Nucl. Sci.
- Journal Volume
- NS-28
- Journal Issue
- 2
- Series
- IEEE Trans. Nucl. Sci.
- Journal Page Range
- 1122-1125
- ISSN
- 0018-9499
Conference
- Title
- 6. conference on application of accelerators in research and industry.
- Dates
- Nov 1980.
- Place
- Denton, TX, USA.
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 13676351
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BISMUTH; BORN APPROXIMATION; COLLISIONS; CROSS SECTIONS; ELECTRON CAPTURE; FLUORINE IONS; GOLD; ION COLLISIONS; IONIZATION; LEAD; M SHELL; MEV RANGE 01-10; URANIUM; VACANCIES; X RADIATION; X-RAY SPECTRA
- Descriptors DEC
- ACTINIDES; CAPTURE; CHARGED PARTICLES; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; ELECTROMAGNETIC RADIATION; ELECTRONIC STRUCTURE; ELEMENTS; ENERGY RANGE; IONIZING RADIATIONS; IONS; METALS; MEV RANGE; POINT DEFECTS; RADIATIONS; SPECTRA; TRANSITION ELEMENTS
Optional Information
- Secondary number(s)
- CONF-801111--.