Identification of phases by X ray diffraction of oxide films grown by oxidation steel AISI 304

Full text: The technique of X-ray diffraction is used to characterize the structural properties of monolayers and films deposited on metal surfaces, but conventional X-ray technique has difficulty in providing information on the thin oxide layer due to penetration of X-ray easily reach the substrate as a result of the film thickness is too thin, thereby providing this information and not the protective film. The oxide films obtained in this work, with a thickness generally less than 2μm generated the need to use the technique of X-ray diffraction with grazing incidence angle that was taken on the premises of the National Synchrotron Light Laboratory (LNLS) where the phases present were identified in the oxide films formed on AISI 304 austenitic stainless steel at temperatures between 750 and 900°C for oxidation times between 22h and 120 respectively. (author)