Published 1986
| Version v1
Report
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Small sample analysis using sputter atomization/resonance ionization mass spectrometry
Description
We have used secondary ion mass spectrometry (SIMS) to investigate the emission of ions via argon sputtering from U metal, UO2, and U3O8 samples. We have also used laser resonance ionization techniques to study argon-sputtered neutral atoms and molecules emitted from these same samples. For the case of U metal, a significant enhancement in detection sensitivity for U is obtained via SA/RIMS. For U in the fully oxidized form (U3O8), SA/RIMS offers no improvement in U detection sensitivity over conventional SIMS when sputtering with argon. 9 refs., 1 fig., 2 tabs
Availability note (English)
MF available from INIS under the Report Number; Available from NTIS, PC A02/MF A01 as DE87000362.Files
18050259.pdf
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Additional details
Publishing Information
- Imprint Pagination
- 6 p.
- Report number
- CONF-8609132--11
Conference
- Title
- Resonance ionization spectroscopy and its application.
- Dates
- 7-12 Sep 1986.
- Place
- Swansea (UK).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 18050259
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ION MICROPROBE ANALYSIS; MASS SPECTROSCOPY; SPUTTERING; TRACE AMOUNTS; URANIUM; URANIUM DIOXIDE; URANIUM IONS; URANIUM OXIDES U3O8
- Descriptors DEC
- ACTINIDE COMPOUNDS; ACTINIDES; ATOMIC IONS; CHALCOGENIDES; CHARGED PARTICLES; CHEMICAL ANALYSIS; ELEMENTS; IONS; METALS; MICROANALYSIS; NONDESTRUCTIVE ANALYSIS; OXIDES; OXYGEN COMPOUNDS; SPECTROSCOPY; URANIUM COMPOUNDS; URANIUM OXIDES