In-situ observation of inorganic nanostructures by combined irradiation (ion beam, electron beam, laser) using multi quantum beam high voltage electron microscope
Creators
- 1. Hokkaido Univ., Faculty of Engineering, Center for Advance Research of Energy and Materials, Sapporo, Hokkaido (Japan)
Description
Just after the Second World War, electron microscope was first introduced to Hokkaido University and the metal physics research has been started using the electron microscope. Now days, electron microscopes are widely used from material science to life science as an important research tool for atomic scale analysis. Many efforts have been done to develop higher spatial resolution by increasing the acceleration voltage due to shortening the wavelength of the electrons during the 20th century. In the 1990s, the highest point resolution of high voltage electron microscopes (HVEMs) with top energy type specimen stage with an acceleration voltage of 1250 kV introduced in the Max Planck Institute in Germany and the University of Tokyo reached 0.1 nm. Recently, Cs corrected scanning transmission electron microscope (STEM) has been successfully developed and it's point to point resolution is reached less than 0.1 nm easily. However, HVEM had advantages that high energy electron can penetrate even a thick specimen, has high potential for in-situ observation and operand observation. In this review, we would like to introduce our multi-quantum beam high voltage electron microscope in Hokkaido University and demonstrate inorganic nanostructures formation by the combined irradiation (ion beam, electron beam, laser light). (author)
Availability note (English)
Available from https://radiation-chemistry.org/kaishi/107pdf/107_49.pdfAbstract (Japanese)
電子顕微鏡の照射系に収差補正装置を適用し観察対象の原子サイズ以下の極限まで電子ビームを絞るプローブコレクターと高精度の電子エネルギー損失分光器を備えた走査透過型電子顕微鏡(STEM/EELS)が実用化されてから,瞬く間に最先端の研究ツールとして世界中の様々な分野に導入され多くの成果をあげている.一方,超高圧電子顕微鏡は,日本と韓国以外では新しい装置の導入がなされていないが,それらによって全て置き換わるとは考えていない.なぜなら,例え収差補正装置によって非弾性散乱電子を除き厚い試料のボケの無い観察がある程度で可能になったとしても,200 kV-300 kVでは透過が難しいほどの厚い省の場合は,1 MVを超える高い加速電圧を有し,試料室周りの自由度が高く原子レベルの分解能を有する超高圧電子顕微鏡は,今後もその場観察やオペランド観察が行える顕微鏡として重要な役割を担うと考えられる.そこで,本学の複合量子ビーム超高圧電子顕微鏡について紹介するとともに複合量子ビーム超高圧電子顕微鏡を用いた複合照射(イオンビーム,電子線,レーザー)による無機ナノ構造の形成とその場観察について紹介する.(著者)Additional details
Additional titles
- Original title (Japanese)
- 複合量子ビーム超高圧電子顕微鏡を用いた複合照射(イオンビーム,電子線,レーザー)による無機ナノ構造の形成とその場観察
Identifiers
Publishing Information
- Journal Title
- Hoshasen Kagaku (Online)
- Journal Issue
- no.107
- Series
- 雑誌名:放射線化学
- Journal Page Range
- p. 49-57
- ISSN
- 2188-0115
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 52097544
- Subject category
- S38: RADIATION CHEMISTRY, RADIOCHEMISTRY AND NUCLEAR CHEMISTRY;
- Descriptors DEI
- BEAM PULSERS; ELECTRIC CURRENTS; ELECTRON BEAMS; ELECTRON GUNS; ELECTRON MICROSCOPES; ION BEAMS; LASER RADIATION; NANOSTRUCTURES; POLARIZATION; SEMICONDUCTOR LASERS; SPATIAL RESOLUTION; TRANSMISSION ELECTRON MICROSCOPY; ULTRAVIOLET RADIATION
- Descriptors DEC
- BEAMS; CURRENTS; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; LASERS; LEPTON BEAMS; MICROSCOPES; MICROSCOPY; PARTICLE BEAMS; RADIATIONS; RESOLUTION; SEMICONDUCTOR DEVICES; SOLID STATE LASERS
Optional Information
- Notes
- 30 refs., 4 figs., 1 tab.