Published October 2010 | Version v1
Journal article

Recombination of charge carriers in the GaAs-based p-i-n diode

  • 1. Tomsk State University (Russian Federation)
  • 2. Tomsk State University of Control Systems and Radioelectronics (Russian Federation)
  • 3. OAO Research Institute of Semiconductor Devices (Russian Federation)
  • 4. Russian Academy of Sciences, Institute of Semiconductor Physics (Russian Federation)

Description

It is established that the radiative recombination of charge carriers plays a substantial role in the GaAs-based p-i-n diodes at high densities of the forward current. It is shown experimentally that the diodes operating in microwave integrated circuits intensely emit light in the IR range with wavelengths from 890 to 910 nm. The obtained results indicate the necessity of taking into account the features of recombination processes in the GaAs-based microwave p-i-n diodes.

Additional details

Identifiers

Publishing Information

Journal Title
Semiconductors
Journal Volume
44
Journal Issue
10
Journal Page Range
p. 1362-1364
ISSN
1063-7826
CODEN
SMICES

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
43040015
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
CHARGE CARRIERS; CURRENTS; DENSITY; EMISSION; GALLIUM ARSENIDES; INTEGRATED CIRCUITS; MICROWAVE RADIATION; RECOMBINATION; VISIBLE RADIATION; WAVELENGTHS
Descriptors DEC
ARSENIC COMPOUNDS; ARSENIDES; ELECTROMAGNETIC RADIATION; ELECTRONIC CIRCUITS; GALLIUM COMPOUNDS; MICROELECTRONIC CIRCUITS; PHYSICAL PROPERTIES; PNICTIDES; RADIATIONS

Optional Information

Copyright
Copyright (c) 2010 Pleiades Publishing, Ltd.