Published October 2010
| Version v1
Journal article
Recombination of charge carriers in the GaAs-based p-i-n diode
Creators
- 1. Tomsk State University (Russian Federation)
- 2. Tomsk State University of Control Systems and Radioelectronics (Russian Federation)
- 3. OAO Research Institute of Semiconductor Devices (Russian Federation)
- 4. Russian Academy of Sciences, Institute of Semiconductor Physics (Russian Federation)
Description
It is established that the radiative recombination of charge carriers plays a substantial role in the GaAs-based p-i-n diodes at high densities of the forward current. It is shown experimentally that the diodes operating in microwave integrated circuits intensely emit light in the IR range with wavelengths from 890 to 910 nm. The obtained results indicate the necessity of taking into account the features of recombination processes in the GaAs-based microwave p-i-n diodes.
Additional details
Identifiers
Publishing Information
- Journal Title
- Semiconductors
- Journal Volume
- 44
- Journal Issue
- 10
- Journal Page Range
- p. 1362-1364
- ISSN
- 1063-7826
- CODEN
- SMICES
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43040015
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CHARGE CARRIERS; CURRENTS; DENSITY; EMISSION; GALLIUM ARSENIDES; INTEGRATED CIRCUITS; MICROWAVE RADIATION; RECOMBINATION; VISIBLE RADIATION; WAVELENGTHS
- Descriptors DEC
- ARSENIC COMPOUNDS; ARSENIDES; ELECTROMAGNETIC RADIATION; ELECTRONIC CIRCUITS; GALLIUM COMPOUNDS; MICROELECTRONIC CIRCUITS; PHYSICAL PROPERTIES; PNICTIDES; RADIATIONS
Optional Information
- Copyright
- Copyright (c) 2010 Pleiades Publishing, Ltd.