On the balance between ion beam induced nanoparticle formation and displacive precipitate resolution in the C-Si system
- 1. Universitaet Augsburg, Universitaetsstrasse 1, 86135 Augsburg (Germany)
Description
Nano-crystals of 3C-SiC can be formed in crystalline silicon with an almost monomodal size distribution by implanting high doses of carbon ions into silicon. The narrow size distribution is thought to be due to a balance between beam-induced precipitate formation and destruction mechanisms. To study the effect of high diffusivities on this balance, in the present investigation carbon implantations were performed at temperatures of 700-1000 deg. C and studied by ERDA, RBS, HRXRD, TEM and STEM. It is found that strained dendritic nano-crystals form at a growth rate apparently governed by the diffusion of C-SiI complexes to the growing precipitates. The observations allow us to conclude general rules for identifying materials systems in which monomodal precipitate distributions may be expected
Additional details
Identifiers
- DOI
- 10.1016/j.msec.2005.09.099;
- PII
- S0928-4931(05)00283-3;
Publishing Information
- Journal Title
- Materials Science and Engineering. C, Biomimetic Materials, Sensors and Systems
- Journal Volume
- 26
- Journal Issue
- 5-7
- Journal Page Range
- p. 857-861
- ISSN
- 0928-4931
Conference
- Title
- Symposium A - Current trends in nanoscience - from materials to applications
- Acronym
- EMRS spring meeting 2005
- Dates
- 31 May - 3 Jun 2005
- Place
- Strasbourg (France)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38066214
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CARBON; CARBON IONS; DENDRITES; DIFFUSION; DISTRIBUTION; DOSES; ION BEAMS; ION IMPLANTATION; NUCLEATION; PRECIPITATION; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SILICON; TEMPERATURE RANGE 0400-1000 K
- Descriptors DEC
- BEAMS; CHARGED PARTICLES; CRYSTALS; ELEMENTS; IONS; NONMETALS; SEMIMETALS; SEPARATION PROCESSES; SPECTROSCOPY; TEMPERATURE RANGE
Optional Information
- Copyright
- Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.