Published July 2006 | Version v1
Journal article

On the balance between ion beam induced nanoparticle formation and displacive precipitate resolution in the C-Si system

  • 1. Universitaet Augsburg, Universitaetsstrasse 1, 86135 Augsburg (Germany)

Description

Nano-crystals of 3C-SiC can be formed in crystalline silicon with an almost monomodal size distribution by implanting high doses of carbon ions into silicon. The narrow size distribution is thought to be due to a balance between beam-induced precipitate formation and destruction mechanisms. To study the effect of high diffusivities on this balance, in the present investigation carbon implantations were performed at temperatures of 700-1000 deg. C and studied by ERDA, RBS, HRXRD, TEM and STEM. It is found that strained dendritic nano-crystals form at a growth rate apparently governed by the diffusion of C-SiI complexes to the growing precipitates. The observations allow us to conclude general rules for identifying materials systems in which monomodal precipitate distributions may be expected

Additional details

Identifiers

DOI
10.1016/j.msec.2005.09.099;
PII
S0928-4931(05)00283-3;

Publishing Information

Journal Title
Materials Science and Engineering. C, Biomimetic Materials, Sensors and Systems
Journal Volume
26
Journal Issue
5-7
Journal Page Range
p. 857-861
ISSN
0928-4931

Conference

Title
Symposium A - Current trends in nanoscience - from materials to applications
Acronym
EMRS spring meeting 2005
Dates
31 May - 3 Jun 2005
Place
Strasbourg (France)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
38066214
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
CARBON; CARBON IONS; DENDRITES; DIFFUSION; DISTRIBUTION; DOSES; ION BEAMS; ION IMPLANTATION; NUCLEATION; PRECIPITATION; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SILICON; TEMPERATURE RANGE 0400-1000 K
Descriptors DEC
BEAMS; CHARGED PARTICLES; CRYSTALS; ELEMENTS; IONS; NONMETALS; SEMIMETALS; SEPARATION PROCESSES; SPECTROSCOPY; TEMPERATURE RANGE

Optional Information

Copyright
Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.