Contribution of nuclear-reaction products into the formation of simple defects in silicon irradiated with electrons and γ-quanta
- 1. Leningradskij Politekhnicheskij Inst. (USSR)
Description
Using the Monte Carlo method, a detailed calculation of the number of simple defects and of the absorbed energy in a silicon sample irradiated by electrons and γ - quanta at energies in the range up 0.5 to 100 MeV has been performed. The program used makes allowance for the following processes: ionization losses; bremsstrahlung; delta -electron production; electron Coulomb multiple scattering; photoeffect; γ -quanta Compton scattering; electron-positron pair production; positron annihilation; γ -quanta elastic scattering on nuclei, and photonuclear reactions. The contribution from nuclear reaction products in the above values has been estimated. It has been shown that at γ -quanta energys above 10 MeV the contribution from ''nuclear'' defects is significant; it becomes predominant in the energy range from 20 to 30 MeV due to the dipole giant resonance. For electron irradiation the above contribution does not exceed 5%. The dose from the charged products of nuclear reactions is not greater than 10% of the total dose absorbed. The distributions of the defect number and the absorbed energy over the sample thickness along the direction of incidence of γ -quanta and electron beams are presented and their characters are discussed
Additional details
Additional titles
- Original title (Russian)
- Вклад продуктов ядерных реакций в образование простых дефектов в кремнии при облучении электронами и γ-квантами
Publishing Information
- Journal Title
- Fiz. Tekh. Poluprovodn.
- Journal Volume
- 9
- Journal Issue
- 6
- Series
- Fiz. Tekh. Poluprovodn.
- Journal Page Range
- 1O49-1O52
INIS
- Country of Publication
- USSR
- Country of Input or Organization
- USSR
- INIS RN
- 10424360
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S36: MATERIALS SCIENCE;
- Descriptors DEI
- ABSORPTION; ANNIHILATION; ATTENUATION; BREMSSTRAHLUNG; COMPTON EFFECT; COULOMB SCATTERING; CRYSTAL DEFECTS; ELECTRON BEAMS; ENERGY DEPENDENCE; GAMMA RADIATION; GIANT RESONANCE; IONIZATION; MEV RANGE 01-10; MEV RANGE 10-100; MONTE CARLO METHOD; PAIR PRODUCTION; PHOTONUCLEAR REACTIONS; PHYSICAL RADIATION EFFECTS; SILICON; SPATIAL DISTRIBUTION
- Descriptors DEC
- BASIC INTERACTIONS; BEAMS; CRYSTAL STRUCTURE; DISTRIBUTION; ELASTIC SCATTERING; ELECTROMAGNETIC INTERACTIONS; ELECTROMAGNETIC RADIATION; ELEMENTS; ENERGY RANGE; INTERACTIONS; IONIZING RADIATIONS; LEPTON BEAMS; MEV RANGE; NUCLEAR REACTIONS; PARTICLE BEAMS; PARTICLE INTERACTIONS; PARTICLE PRODUCTION; RADIATION EFFECTS; RADIATIONS; RESONANCE; SCATTERING; SEMIMETALS
Optional Information
- Notes
- 10 refs.; for English translation see the journal Sov. Phys. - Semicond.