Published July 21, 2001
| Version v1
Journal article
Observation of hard X-ray pulses with a highly sensitive streak camera
Creators
Description
We have developed a highly sensitive X-ray streak camera system, which synchronously operates with the RF signal of the SPring-8 storage ring. The streak camera was installed at an undulator beamline of SPring-8, and the beam loading effect for various electron bunch structures (filling pattern) has been observed. The camera has also been operated as a timing monitor for a synchronization system of synchrotron radiation and a Ti:sapphire laser. The highly sensitive X-ray streak camera system can be used not only as an accelerator diagnosis, but also as a fast temporal detector for beamline applications, such as the observation of fast temporal transitions of diffraction images and relaxation process
Additional details
Identifiers
- PII
- S0168900201006118;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 467-468
- Journal Issue
- 1
- Journal Page Range
- p. 1125-1128
- ISSN
- 0168-9002
- CODEN
- NIMAER
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Germany
- INIS RN
- 34013967
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- BEAM BUNCHING; BEAM MONITORS; BEAM TRANSPORT; HARD X RADIATION; ONDULATOR RADIATION; PHOTON BEAMS; POSITION SENSITIVE DETECTORS; PULSE TECHNIQUES; RELAXATION; SPRING-8 STORAGE RING; STREAK CAMERAS; SYNCHRONIZATION; SYNCHROTRON RADIATION; TIME DEPENDENCE; X-RAY DETECTION; X-RAY DIFFRACTION
- Descriptors DEC
- BEAM DYNAMICS; BEAMS; BREMSSTRAHLUNG; CAMERAS; COHERENT SCATTERING; DETECTION; DIFFRACTION; DYNAMICS; ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; MEASURING INSTRUMENTS; MECHANICS; MONITORS; RADIATION DETECTION; RADIATION DETECTORS; RADIATION SOURCES; RADIATIONS; SCATTERING; STORAGE RINGS; SYNCHROTRON RADIATION SOURCES; X RADIATION
Optional Information
- Copyright
- Copyright (c) 2001 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.