Published February 11, 1999
| Version v1
Journal article
Performance of CdZnTe detectors passivated with energetic oxygen atoms
Creators
- 1. Mail Stop E540, Safeguards Science and Technology group, NIS-5, Los Alamos, National Laboratory, Los Alamos, NM 87545 (United States)
- 2. Department of Chemistry, University of Alabama, Huntsville, AL 35899 (United States)
- 3. Lawrence Berkeley Laboratory, 1 Cyclotron Road, Mailstop 70A-3363, Berkeley, CA 94720 (United States)
- 4. eV Products, 374 Saxonburg Blvd., Saxonburg, PA 16056 (United States)
Description
Noise caused by surface-leakage current can degrade the performance of CdZnTe spectrometers, particularly devices with closely spaced contacts such as coplanar grid detectors. In order to reduce surface leakage, we are treating CdZnTe detector surfaces with energetic, neutral oxygen atoms. Energetic oxygen atoms react with the surface to form a resistive oxide layer. Because the reaction is effective at room temperature, deleterious heating of the substrate is avoided. In most cases, leakage current and noise are shown to decrease significantly after treatment. The effect of the treatment on the performance of coplanar grid detectors is presented
Additional details
Identifiers
- PII
- S0168900298009516;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 422
- Journal Issue
- 1-3
- Journal Page Range
- p. 179-184
- ISSN
- 0168-9002
- CODEN
- NIMAER
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Kazakhstan
- INIS RN
- 34040689
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ATOMS; CDTE SEMICONDUCTOR DETECTORS; LEAKAGE CURRENT; NOISE; OXYGEN; PERFORMANCE; SURFACE TREATMENTS
- Descriptors DEC
- CURRENTS; ELECTRIC CURRENTS; ELEMENTS; MEASURING INSTRUMENTS; NONMETALS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS
Optional Information
- Copyright
- Copyright (c) 1999 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.