Molecular beam epitaxy of interband cascade structures with InAs/GaSb superlattice absorbers for long-wavelength infrared detection
Creators
- 1. School of Electrical and Computer Engineering, University of Oklahoma, Norman, OK 73019 (United States)
- 2. Homer L. Dodge Department of Physics and Astronomy, University of Oklahoma, Norman, OK 73019 (United States)
Description
The interfaces of InAs/GaSb superlattices (SLs) were studied with the goal of improving interband cascade infrared photodetectors (ICIPs) designed for the long-wavelength infrared region. Two ICIP structures with different SL interfaces were grown by molecular beam epitaxy, one with a ∼1.2 monolayer (ML) InSb layer inserted intentionally only at the GaSb-on-InAs interfaces and another with a ∼0.6 ML InSb layer inserted at both InAs-on-GaSb and GaSb-on-InAs interfaces. The material quality of the ICIP structures was similar according to characterization by differential interference contrast microscopy, atomic force microscopy, and x-ray diffraction. The performances of the ICIP devices were not substantially different despite the different interface structure. Both ICIPs had a peak detectivity of >3.7 × 1010 Jones at 78 K with a cutoff wavelength near 9.2 μm. The maximum operation temperatures of both ICIPs were as high as ∼250 K, although the structures were not fully optimized. This suggests that the two interface arrangements may have a similar effect on structural, optical and electrical properties. Alternatively, the device performance of the ICIPs may be limited by mechanisms unrelated to the interfaces. In either case, the arrangement of dividing a thick continuous InSb layer at the GaSb-on-InAs interface into thinner InSb layers at both interfaces can be used to achieve strain balance in SL detectors for longer wavelengths. This suggests that with further improvements ICIPs should be able to operate at higher temperatures at even longer wavelengths. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/0268-1242/30/10/105029Additional details
Identifiers
Publishing Information
- Journal Title
- Semiconductor Science and Technology
- Journal Volume
- 30
- Journal Issue
- 10
- Journal Page Range
- [7 p.]
- ISSN
- 0268-1242
- CODEN
- SSTEET
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 47076903
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; BALANCES; ELECTRICAL PROPERTIES; GALLIUM ANTIMONIDES; INDIUM ANTIMONIDES; INDIUM ARSENIDES; INFRARED RADIATION; INTERFACES; LAYERS; MOLECULAR BEAM EPITAXY; PERFORMANCE; PHOTODETECTORS; STRAINS; SUPERLATTICES; TEMPERATURE RANGE 0400-1000 K; WAVELENGTHS; X-RAY DIFFRACTION
- Descriptors DEC
- ANTIMONIDES; ANTIMONY COMPOUNDS; ARSENIC COMPOUNDS; ARSENIDES; COHERENT SCATTERING; CRYSTAL GROWTH METHODS; DIFFRACTION; ELECTROMAGNETIC RADIATION; EPITAXY; GALLIUM COMPOUNDS; INDIUM COMPOUNDS; MEASURING INSTRUMENTS; MICROSCOPY; PHYSICAL PROPERTIES; PNICTIDES; RADIATIONS; SCATTERING; TEMPERATURE RANGE; WEIGHT INDICATORS