Published 2000
| Version v1
Book
Atomic force microscopic study on etching property near the ion tracks in CR-39 plastic detector
Creators
- 1. Department of Quantum Engineering and Systems Science, Univ. of Tokyo, Tokyo (Japan)
- 2. National Institute of Radiological Sciences, Chiba (Japan)
- 3. College of Industrial Technology, Nihon Univ., Narashino, Chiba (Japan)
Description
Very small etch pits on CR-39 plastic track detectors were measured with an AFM (Atomic Force Microscope) for protons and heliums with MeV order energies or less. Even in early stage of etching process, the diameter of etch pits increased with the stopping power of charged particles. The large deviation of the diameter of these etch pits is seem to have some informations on the track structure. (author)
Additional details
Publishing Information
- Publisher
- Tokyo Univ.
- Imprint Place
- Tokyo (Japan)
- ISBN
- 4-901332-00-4
- Imprint Title
- Proceedings of the first international symposium on supercritical water-cooled reactors, design and technology
- Imprint Pagination
- 296 p.
- Journal Page Range
- p. 294-296
Conference
- Title
- 1. international symposium on supercritical water-cooled reactors, design and technology
- Acronym
- SCR-2000
- Dates
- 6-9 Nov 2000
- Place
- Tokyo (Japan)
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 32050035
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- DIELECTRIC TRACK DETECTORS; ENERGY DEPENDENCE; ETCHING; HEAVY IONS; HELIUM 4 BEAMS; ION MICROSCOPES; LET; PLASTICS; PROTON BEAMS; STOPPING POWER
- Descriptors DEC
- BEAMS; CHARGED PARTICLES; ENERGY TRANSFER; ION BEAMS; IONS; MATERIALS; MEASURING INSTRUMENTS; MICROSCOPES; NUCLEON BEAMS; ORGANIC COMPOUNDS; ORGANIC POLYMERS; PARTICLE BEAMS; PETROCHEMICALS; PETROLEUM PRODUCTS; POLYMERS; RADIATION DETECTORS; SURFACE FINISHING; SYNTHETIC MATERIALS
Optional Information
- Notes
- 10 refs., 2 figs.