X-ray diffraction analysis of intergranular strains in cold-rolled ultra high purity iron
Creators
Description
Intergranular strain and the associated stored energy were investigated by X-ray diffraction in two texture components of cold-rolled ultra high purity (UHP) iron. Laue peaks were measured on plastically deformed samples and the center of the lines was compared with reference peaks recorded from a well-annealed powder sample of the same material. The intergranular stored energy as evaluated from the residual strain tensor was found to be much higher for the [1 1 0](0 0 1) α fibre component than for the [1 2 1](1-1 1) γ fibre component. Experimental results show that the soft α grains of the polycrystal, containing fewer dislocations, are more strained by their surrounding than hard γ grains with more dislocations. Generally intergranular strains decrease with deformation
Additional details
Identifiers
- DOI
- 10.1016/j.msea.2004.03.088;
- PII
- S0921509304005039;
Publishing Information
- Journal Title
- Materials Science and Engineering. A, Structural Materials: Properties, Microstructure and Processing
- Journal Volume
- 387-389
- Journal Issue
- 2-3
- Journal Page Range
- p. 231-234
- ISSN
- 0921-5093
- CODEN
- MSAPE3
Conference
- Title
- 13. international conference on the strength of materials
- Dates
- 25-30 Aug 2003
- Place
- Budapest (Hungary)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38055539
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANNEALING; DEFORMATION; DISLOCATIONS; IRON; PEAKS; POWDERS; STORED ENERGY; STRAINS; STRESSES; TENSORS; TEXTURE; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; DIFFRACTION; ELEMENTS; ENERGY; HEAT TREATMENTS; LINE DEFECTS; METALS; PHYSICAL PROPERTIES; SCATTERING; THERMODYNAMIC PROPERTIES; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.