Published May 15, 2000
| Version v1
Journal article
Polycrystalline metal surfaces studied by X-ray photoelectron spectro-microscopy
- 1. Department of Physics, King's College London (United Kingdom)
- 2. Sincrotrone Trieste, 32014 Trieste (Italy)
Description
The scanning photoelectron microscope (SPEM) on beam line 2.2 at the Elettra synchrotron produces small spot XPS spectra from a sub-micron radiation microprobe. It is also capable of producing surface images in terms of the energy resolved photoelectron signal. This microscope has been used to study oxidation on polycrystalline tin and lead surfaces and the variations in reactivity between different crystallite surfaces. The diffusion of gold and silver films on polycrystalline metal surfaces has also been followed
Additional details
Identifiers
- DOI
- 10.1063/1.1291156;
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 507
- Journal Issue
- 1
- Journal Page Range
- p. 269-273
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- 6. international conference on X-ray microscopy
- Dates
- 2-6 Aug 1999
- Place
- Berkeley, CA (United States)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 35069961
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANNEALING; GOLD; LEAD; MICROSCOPES; OXIDATION; POLYCRYSTALS; REACTIVITY; SCANNING ELECTRON MICROSCOPY; SILVER; SURFACES; SYNCHROTRON RADIATION; THIN FILMS; TIN; X RADIATION; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- BREMSSTRAHLUNG; CHEMICAL REACTIONS; CRYSTALS; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; ELECTRON SPECTROSCOPY; ELEMENTS; FILMS; HEAT TREATMENTS; IONIZING RADIATIONS; METALS; MICROSCOPY; PHOTOELECTRON SPECTROSCOPY; RADIATIONS; SPECTROSCOPY; TRANSITION ELEMENTS
Optional Information
- Notes
- (c) 2000 American Institute of Physics.