Published April 15, 2011
| Version v1
Journal article
Diffraction from carbon nanotubes
Creators
- 1. NanoLab, Faculty of Physics, University of Belgrade, POB 368, Belgrade 11001 (Serbia)
Description
Full symmetry based analysis enables direct insight into various features of the diffraction patterns of carbon nanotubes. In particular, determination of the chiral indices of nanotubes may be performed.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.mseb.2010.05.006Additional details
Identifiers
- DOI
- 10.1016/j.mseb.2010.05.006;
- PII
- S0921-5107(10)00351-X;
Publishing Information
- Journal Title
- Materials Science and Engineering. B, Solid-State Materials for Advanced Technology
- Journal Volume
- 176
- Journal Issue
- 6
- Journal Page Range
- p. 497-499
- ISSN
- 0921-5107
- CODEN
- MSBTEK
Conference
- Title
- 6. international conference on nanosciences and nanotechnologies
- Dates
- 13-15 Jul 2009
- Place
- Thessaloniki (Greece)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43030596
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CARBON; CHIRALITY; CRYSTALS; DIFFRACTION; NANOTUBES; SYMMETRY
- Descriptors DEC
- COHERENT SCATTERING; ELEMENTS; NANOSTRUCTURES; NONMETALS; PARTICLE PROPERTIES; SCATTERING
Optional Information
- Copyright
- Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.