Equipment to study the gamma total dose effects on components of microcomputing systems

Robotics in hostile environment is affected by the effects of the gamma total dose on microcomputing electronic components. A dose of 1000 Gy is expected particularly for the CMOS technology. A test equipment adapted to these components is developed by CEA/DEIN in order to investigate their irradiation hardness assurance. The purpose of this paper is to describe the test equipment. The three following methods are got down to work: test after irradiation, test on line and nominal running test on line. Different results obtained for numerous components are presented to compare the methods and to determine which components have reached the objectif. To conclude, the future prospects to a more adapted test structure and the orientation of new test equipment for other very interesting electronic components are discussed