Published September 21, 2009 | Version v1
Journal article

Epitaxial growth and characterization of Eu0.5Sr0.5CoO3 thin films by off-axis sputtering

  • 1. Department of Physics and Research Center for Dielectric and Advanced Matter Physics, Pusan National University, Busan 609-735 (Korea, Republic of)
  • 2. Department of Advanced Materials Science, University of Tokyo, Chiba 277-8561 (Japan)
  • 3. Japan Science and Technology Agency, Kawaguchi 332-0012 (Japan)

Description

We report the epitaxial growth and physical properties of Eu0.5Sr0.5CoO3 (ESCO) thin films deposited on (001) LaAlO3 (LAO) and (001) SrTiO3 (STO) substrates by off-axis rf sputtering. The magnetic properties of a grown film are governed by the crystallinity of the thin film and strain effects due to the substrate. The temperature-dependent resistivity of an optimized ESCO thin film on a LAO substrate shows a characteristic sudden decrease near the ferromagnetic transition temperature, indicating metallic double-exchange-like behavior, while the resistivity of ESCO on a STO substrate displays insulatinglike behavior because of substrate strain. These results suggest that optimized ESCO film on LAO is ideal as a bottom electrode for strained dielectric and ferroelectric heterostructures.

Additional details

Identifiers

Publishing Information

Journal Title
Applied Physics Letters
Journal Volume
95
Journal Issue
12
Journal Page Range
p. 122505-122505.3
ISSN
0003-6951
CODEN
APPLAB

Optional Information

Notes
(c) 2009 American Institute of Physics