Published June 24, 2009
| Version v1
Journal article
Oxidation behavior of base metal, weld metal and HAZ regions of SMAW weldment in ASTM SA210 GrA1 steel
Creators
- 1. Metallurgical and Materials Engineering Department, Indian Institute of Technology Roorkee, Roorkee 247667 (India)
Description
Shielded metal arc welding (SMAW) was used to weld together ASTM SA210 GrA1 steel. The oxidation studies were conducted on different regions of shielded metal arc weldment i.e., base metal, weld metal and heat affected zone (HAZ) specimens after exposure to air at 900 deg. C under cyclic conditions. The thermo-gravimetric technique was used to establish kinetics of oxidation. X-ray diffraction (XRD) and scanning electron microscopy/energy-dispersive analysis (SEM/EDAX) techniques were used to analyze the oxidation products. Base metal showed more weight gain than that of weld metal and HAZ. The HAZ specimen showed the least weight gain due to the formation of densely inner oxide scale.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.jallcom.2008.12.110Additional details
Identifiers
- DOI
- 10.1016/j.jallcom.2008.12.110;
- PII
- S0925-8388(08)02320-7;
Publishing Information
- Journal Title
- Journal of Alloys and Compounds
- Journal Volume
- 479
- Journal Issue
- 1-2
- Journal Page Range
- p. 432-435
- ISSN
- 0925-8388
- CODEN
- JALCEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41051312
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- HEAT AFFECTED ZONE; KINETICS; OXIDATION; SCANNING ELECTRON MICROSCOPY; SHIELDED METAL-ARC WELDING; STEELS; TEMPERATURE RANGE 1000-4000 K; WELDED JOINTS; X-RAY DIFFRACTION
- Descriptors DEC
- ALLOYS; ARC WELDING; CARBON ADDITIONS; CHEMICAL REACTIONS; COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; FABRICATION; IRON ALLOYS; IRON BASE ALLOYS; JOINING; JOINTS; MICROSCOPY; SCATTERING; TEMPERATURE RANGE; TRANSITION ELEMENT ALLOYS; WELDING; ZONES
Optional Information
- Copyright
- Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.