Published January 28, 2016 | Version v1
Journal article

Development of high-resolution x-ray CT system using parallel beam geometry

  • 1. Central Research Laboratory, Hitachi Ltd., Hatoyama, Saitama (Japan)
  • 2. Institute of Materials Science, High Energy Accelerator Research Organization, Tsukuba, Ibaraki (Japan)
  • 3. School of Allied Health Sciences, Kitasato University, Sagamihara, Kanagawa (Japan)
  • 4. Department of Orthodontics, School of Dentistry Showa University, Ota-ku, Tokyo (Japan)
  • 5. Kyushu Synchrotron Light Research Center, Tosu, Saga (Japan)

Description

For fine three-dimensional observations of large biomedical and organic material samples, we developed a high-resolution X-ray CT system. The system consists of a sample positioner, a 5-μm scintillator, microscopy lenses, and a water-cooled sCMOS detector. Parallel beam geometry was adopted to attain a field of view of a few mm square. A fine three-dimensional image of birch branch was obtained using a 9-keV X-ray at BL16XU of SPring-8 in Japan. The spatial resolution estimated from the line profile of a sectional image was about 3 μm

Additional details

Identifiers

Publishing Information

Journal Title
AIP Conference Proceedings
Journal Volume
1696
Journal Issue
1
Journal Page Range
p. 020007-020007.4
ISSN
0094-243X
CODEN
APCPCS

Conference

Title
12. international conference on X-ray microscopy
Acronym
XRM 2014
Dates
26-31 Oct 2014
Place
Melbourne (Australia)

Optional Information

Notes
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