Published May 2004 | Version v1
Journal article

Numerical simulation multicomponent ion beam transport from ECR ion source

  • 1. Institute of Modern Physics, the Chinese Academy of Science, 730000 Lanzhou (China)

Description

We are developing a multicharged ion beam transport program. The program is dedicated to numerical simulation of the behavior of highly charged ion beam and optimization of beam optics in transport lines and is realized on a PC with Windows user interface of Microsoft Visual Basic. Among all the ions with different charge states in the beam, the exchange of electrons between highly charged ions and low charged ions or neutral atoms of residual gas are taken into account using classical molecular over-barrier model and Monte Carlo method. Therefore, the code is able to describe the changing charge state distribution along the transmission line. The initial charged state distribution of ions may be input from experimental data or calculated from some classical density distribution such as uniform, Gaussian, water bag, or parabolic. The main advantage of the code is the ability to simultaneously simulate a number of ions with different masses and charge states, particularly the decrease of the highly charge ions and the increase of low charged ions due to electron capture. Some simulation results for a transmission line of a highly charged ECR ion source are presented

Additional details

Identifiers

Publishing Information

Journal Title
Review of Scientific Instruments
Journal Volume
75
Journal Issue
5
Journal Page Range
p. 1494-1496
ISSN
0034-6748
CODEN
RSINAK

Conference

Title
10. international conference on ion sources (ICIS)
Dates
8-13 Sep 2003
Place
Dubna (Russian Federation)

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
36010295
Subject category
S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
Resource subtype / Literary indicator
Conference
Descriptors DEI
BEAM OPTICS; BEAM TRANSPORT; CHARGE STATES; ECR ION SOURCES; ELECTRON CAPTURE; ELECTRONS; ION BEAMS; MONTE CARLO METHOD; MULTICHARGED IONS; OPTIMIZATION; POWER TRANSMISSION LINES; SIMULATION
Descriptors DEC
BEAMS; CALCULATION METHODS; CAPTURE; CHARGED PARTICLES; ELEMENTARY PARTICLES; FERMIONS; ION SOURCES; IONS; LEPTONS

Optional Information

Notes
(c) 2004 American Institute of Physics.