Scintillation luminescence for high-pressure xenon gas
Description
Scintillation and ionization yields in xenon gas for 5.49 MeV alpha-particles were measured in the range of pressure from 0.35 to 3.7 MPa and the electric field strength (E) over the number density of xenon atoms (N), E/N from 0 to 5x10-18 V cm2. When our data are normalized at the data point measured by Saito et al., the number of scintillation photons is 2.3x105 while the number of ionization electrons is 2.0x105 at 2.6 MPa and at 3.7x10-18 V cm2. The scintillation and ionization yields of xenon doped with 0.2% hydrogen, High-Pressure Xenon gas[H2-0.2%], at 2.6 MPa was also measured. Scintillation yield of the Xe-H2 mixture gas is 80% as high as that of pure xenon. It is found that the scintillation yield is luminous enough to generate a trigger pulse of the high-pressure xenon time projection chamber, which is expected as a promising MeV Compton gamma-ray camera
Additional details
Identifiers
- DOI
- 10.1016/j.nima.2004.06.024;
- PII
- S0168900204011891;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 531
- Journal Issue
- 1-2
- Journal Page Range
- p. 327-332
- ISSN
- 0168-9002
- CODEN
- NIMAER
Conference
- Title
- 5. international workshop on radiation imaging detectors
- Dates
- 7-11 Sep 2003
- Place
- Riga (Latvia)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 36019099
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ALPHA PARTICLES; ATOMS; DENSITY; ELECTRIC FIELDS; ELECTRONS; GAMMA CAMERAS; HYDROGEN ADDITIONS; IONIZATION; LUMINESCENCE; MEV RANGE; MIXTURES; PHOTONS; PRESSURE DEPENDENCE; PRESSURE RANGE MEGA PA 01-10; PULSES; SCINTILLATIONS; TIME PROJECTION CHAMBERS; XENON; YIELDS
- Descriptors DEC
- BOSONS; CAMERAS; CHARGED PARTICLES; DISPERSIONS; DRIFT CHAMBERS; ELEMENTARY PARTICLES; ELEMENTS; EMISSION; ENERGY RANGE; FERMIONS; FLUIDS; GASES; IONIZING RADIATIONS; LEPTONS; MASSLESS PARTICLES; MEASURING INSTRUMENTS; MULTIWIRE PROPORTIONAL CHAMBERS; NONMETALS; PHOTON EMISSION; PHYSICAL PROPERTIES; PRESSURE RANGE; PRESSURE RANGE MEGA PA; PROPORTIONAL COUNTERS; RADIATION DETECTORS; RADIATIONS; RARE GASES
Optional Information
- Copyright
- Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.