Imaging x-ray Thomson scattering spectrometer design and demonstration (invited)
Creators
- 1. University of Michigan, Ann Arbor, Michigan 48105 (United States)
- 2. Los Alamos National Laboratory, Los Alamos, New Mexico 87545 (United States)
Description
In many laboratory astrophysics experiments, intense laser irradiation creates novel material conditions with large, one-dimensional gradients in the temperature, density, and ionization state. X-ray Thomson scattering is a powerful technique for measuring these plasma parameters. However, the scattered signal has previously been measured with little or no spatial resolution, which limits the ability to diagnose inhomogeneous plasmas. We report on the development of a new imaging x-ray Thomson spectrometer (IXTS) for the Omega laser facility. The diffraction of x-rays from a toroidally curved crystal creates high-resolution images that are spatially resolved along a one-dimensional profile while spectrally dispersing the radiation. This focusing geometry allows for high brightness while localizing noise sources and improving the linearity of the dispersion. Preliminary results are presented from a scattering experiment that used the IXTS to measure the temperature profile of a shocked carbon foam.
Additional details
Identifiers
- DOI
- 10.1063/1.4731755;
Publishing Information
- Journal Title
- Review of Scientific Instruments
- Journal Volume
- 83
- Journal Issue
- 10
- Journal Page Range
- p. 10E108-10E108.5
- ISSN
- 0034-6748
- CODEN
- RSINAK
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44052297
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- BRIGHTNESS; CARBON; CRYSTALS; FOAMS; INHOMOGENEOUS PLASMA; IONIZATION; LASER RADIATION; PLASMA DIAGNOSTICS; SPATIAL RESOLUTION; SPECTROMETERS; THOMSON SCATTERING; X RADIATION; X-RAY DIFFRACTION; X-RAY SPECTROSCOPY
- Descriptors DEC
- COHERENT SCATTERING; COLLOIDS; DIFFRACTION; DISPERSIONS; ELECTROMAGNETIC RADIATION; ELEMENTS; INELASTIC SCATTERING; IONIZING RADIATIONS; MEASURING INSTRUMENTS; NONMETALS; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; PLASMA; RADIATIONS; RESOLUTION; SCATTERING; SPECTROSCOPY
Optional Information
- Notes
- (c) 2012 American Institute of Physics