Published October 2012 | Version v1
Journal article

Imaging x-ray Thomson scattering spectrometer design and demonstration (invited)

  • 1. University of Michigan, Ann Arbor, Michigan 48105 (United States)
  • 2. Los Alamos National Laboratory, Los Alamos, New Mexico 87545 (United States)

Description

In many laboratory astrophysics experiments, intense laser irradiation creates novel material conditions with large, one-dimensional gradients in the temperature, density, and ionization state. X-ray Thomson scattering is a powerful technique for measuring these plasma parameters. However, the scattered signal has previously been measured with little or no spatial resolution, which limits the ability to diagnose inhomogeneous plasmas. We report on the development of a new imaging x-ray Thomson spectrometer (IXTS) for the Omega laser facility. The diffraction of x-rays from a toroidally curved crystal creates high-resolution images that are spatially resolved along a one-dimensional profile while spectrally dispersing the radiation. This focusing geometry allows for high brightness while localizing noise sources and improving the linearity of the dispersion. Preliminary results are presented from a scattering experiment that used the IXTS to measure the temperature profile of a shocked carbon foam.

Additional details

Identifiers

Publishing Information

Journal Title
Review of Scientific Instruments
Journal Volume
83
Journal Issue
10
Journal Page Range
p. 10E108-10E108.5
ISSN
0034-6748
CODEN
RSINAK

Optional Information

Notes
(c) 2012 American Institute of Physics