Published August 2012 | Version v1
Journal article

A collinear self-emission and laser-backlighting imaging diagnostic

  • 1. University of California San Diego, La Jolla, California 92093-0417 (United States)
  • 2. General Atomics, San Diego, California 92121 (United States)
  • 3. Comision Chilena de Energia Nuclear, Casilla 188-D, Santiago (Chile)
  • 4. Laboratory for Plasma Studies, Cornell University, Ithaca, New York 14850 (United States)

Description

In this work we demonstrate a design for obtaining laser backlighting (e.g., interferometry) and time-resolved extreme ultraviolet self-emission images along the same line-of-sight. This is achieved by modifying a single optical component in the laser collection optics with apertures and pinhole arrangements suitable for single or multiple frame imaging onto a gated detector, such as a microchannel plate. Test results for exploding wire experiments show that machining of the optic does not affect the overall quality of the recovered laser images, and that, even with a multiple frame system, the area sacrificed to achieve collinear imaging is relatively small. The diagnostics can therefore allow direct correlation of laser and self-emission images and their derived quantities, such as electron density in the case of interferometry. Simple methods of image correlation are also demonstrated.

Additional details

Identifiers

Publishing Information

Journal Title
Review of Scientific Instruments
Journal Volume
83
Journal Issue
8
Journal Page Range
p. 083507-083507.7
ISSN
0034-6748
CODEN
RSINAK

Optional Information

Notes
(c) 2012 American Institute of Physics