Published November 2004 | Version v1
Journal article Metadata-only

Structural and thermoelectric properties in (Sb1-xBix)2Te3 thin films

Creators

  • 1. University of Ulsan, Department of Physics (Korea, Republic of)
  • 2. Kwangwoon University, Department of Electrophysics (Korea, Republic of)
  • 3. Northwestern University, Department of Physics and Astronomy (United States)

Description

We have investigated the structural and thermoelectric properties of (Sb1-xBix)2Te3 thin films on CdTe(111)B. Analysis of X-ray diffraction patterns (θ–2θ scans and rocking curves) of the films shows that they are of high quality and that they are well aligned with their (00.1) axis normal to the substrates. Measurements of the temperature-dependent thermoelectric power, resistivity, and Hall coefficient of the films were performed with respect to the binary composition, x. For the samples in the range 0.219 cm-3, and the room-temperature mobilities were 24.6–64.0 cm2 V-1 s-1.

Additional details

Identifiers

DOI
10.1007/s00339-004-2702-2;

Publishing Information

Journal Title
Applied Physics. A, Materials Science and Processing (Print)
Journal Volume
79
Journal Issue
7
Journal Page Range
p. 1729-1731
ISSN
0947-8396
CODEN
APAMFC

INIS

Country of Publication
Germany
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
54062852
Subject category
S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
CADMIUM TELLURIDES; MOBILITY; NEUTRON DIFFRACTION; SUBSTRATES; TEMPERATURE DEPENDENCE; THERMOELECTRIC PROPERTIES; THIN FILMS; X-RAY DIFFRACTION
Descriptors DEC
CADMIUM COMPOUNDS; CHALCOGENIDES; COHERENT SCATTERING; DIFFRACTION; ELECTRICAL PROPERTIES; FILMS; PHYSICAL PROPERTIES; SCATTERING; TELLURIDES; TELLURIUM COMPOUNDS

Optional Information

Copyright
Copyright (c) 2004 Springer-Verlag
Notes
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