Published February 2006 | Version v1
Journal article

Electron diffraction analysis of individual single-walled carbon nanotubes

  • 1. Max Planck Institute for Solid State Research, Stuttgart (Germany)
  • 2. Laboratiore des Colloides, Verres et Nanomateriaux, Universite de Montpellier II (France)
  • 3. Infineon Technologies Corporate Research, Munich (Germany)

Description

We present a detailed electron diffraction study of individual single-walled carbon nanotubes. A novel sample preparation procedure provides well-separated, long and straight individual single-shell nanotubes. Diffraction experiments are carried out at 60kV, below the threshold for knock-on damage in carbon nanotubes. We describe experimental parameters that allow single-tube electron diffraction experiments with widely available thermal emission transmission electron microscopes. Further, we review the simulation of diffraction patterns for these objects

Additional details

Identifiers

DOI
10.1016/j.ultramic.2005.07.008;
arXiv
arXiv:cond-mat/0506356v2;
PII
S0304-3991(05)00178-6;

Publishing Information

Journal Title
Ultramicroscopy (Amsterdam)
Journal Volume
106
Journal Issue
3
Journal Page Range
p. 176-190
ISSN
0304-3991
CODEN
ULTRD6

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
37094290
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
CARBON; DAMAGE; ELECTRON DIFFRACTION; KNOCK-ON; NANOTUBES; SAMPLE PREPARATION; TRANSMISSION ELECTRON MICROSCOPY
Descriptors DEC
COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; ELEMENTS; MICROSCOPY; NANOSTRUCTURES; NONMETALS; SCATTERING

Optional Information

Copyright
Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.