Published February 2006
| Version v1
Journal article
Electron diffraction analysis of individual single-walled carbon nanotubes
- 1. Max Planck Institute for Solid State Research, Stuttgart (Germany)
- 2. Laboratiore des Colloides, Verres et Nanomateriaux, Universite de Montpellier II (France)
- 3. Infineon Technologies Corporate Research, Munich (Germany)
Description
We present a detailed electron diffraction study of individual single-walled carbon nanotubes. A novel sample preparation procedure provides well-separated, long and straight individual single-shell nanotubes. Diffraction experiments are carried out at 60kV, below the threshold for knock-on damage in carbon nanotubes. We describe experimental parameters that allow single-tube electron diffraction experiments with widely available thermal emission transmission electron microscopes. Further, we review the simulation of diffraction patterns for these objects
Additional details
Identifiers
- DOI
- 10.1016/j.ultramic.2005.07.008;
- arXiv
- arXiv:cond-mat/0506356v2;
- PII
- S0304-3991(05)00178-6;
Publishing Information
- Journal Title
- Ultramicroscopy (Amsterdam)
- Journal Volume
- 106
- Journal Issue
- 3
- Journal Page Range
- p. 176-190
- ISSN
- 0304-3991
- CODEN
- ULTRD6
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37094290
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CARBON; DAMAGE; ELECTRON DIFFRACTION; KNOCK-ON; NANOTUBES; SAMPLE PREPARATION; TRANSMISSION ELECTRON MICROSCOPY
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; ELEMENTS; MICROSCOPY; NANOSTRUCTURES; NONMETALS; SCATTERING
Optional Information
- Copyright
- Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.