Study on the distribution of radiation intensity of X-ray machine for industrial CT
Creators
- 1. School of Nuclear Science and Technology, Lanzhou University, Lanzhou (China)
Description
Background: X-ray machine is the most-extensively-used X-ray source in industrial CT, due to its anode effect and the restrictions of its own structure, the radiation intensity distribution is not uniform. Purpose: The aim is to research and measure the radiation intensity distribution of X-ray machine as a vital part of imaging correction and the foundation for the precise application of X-ray machine. Methods: The CsI(Tl) scintillation and photodiode detector is used to measure the radiation intensity distribution of the MXR225/22 X-ray machine (made by Swiss COMET Inc.) along with various angles on different axis. At the same time, the radiation intensity distribution is simulated by Monte Carlo method. Results: The 'broadening effect' is observed, and the boundary radiation intensity distribution broadening phenomena can be explained thereby. The radiation intensity distributions of the large and small focal are compared, and the reason for the difference in the cathode ends is analyzed. And the 2D radiation intensity distribution of X-ray machine is given. Conclusion: The results showed that in the 20° opening angle range (-10°-+10°), the radiation intensity distributes uniformly, the larger opening angle, the worse distribution uniformity. The radiation distribution extension occurs at the boundary of cathode side. (authors)
Additional details
Identifiers
Publishing Information
- Journal Title
- Nuclear Techniques
- Journal Volume
- 38
- Journal Issue
- 9
- Journal Page Range
- [5 p.]
- ISSN
- 0253-3219
INIS
- Country of Publication
- China
- Country of Input or Organization
- China
- INIS RN
- 49102361
- Subject category
- S42: ENGINEERING;
- Descriptors DEI
- ANODES; CAT SCANNING; CATHODES; COMPARATIVE EVALUATIONS; DISTRIBUTION; INDUSTRIAL RADIOGRAPHY; MONTE CARLO METHOD; PHOTODIODES; SCINTILLATIONS; SIMULATION; X RADIATION; X-RAY SOURCES
- Descriptors DEC
- CALCULATION METHODS; COMPUTERIZED TOMOGRAPHY; DIAGNOSTIC TECHNIQUES; ELECTRODES; ELECTROMAGNETIC RADIATION; EVALUATION; IONIZING RADIATIONS; MATERIALS TESTING; NONDESTRUCTIVE TESTING; RADIATION SOURCES; RADIATIONS; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; TESTING; TOMOGRAPHY
Optional Information
- Notes
- 9 figs., 9 refs.; http://dx.doi.org/10.11889/j.0253-3219.2015.hjs.38.090201