Published August 1992
| Version v1
Journal article
Determination of stoichiometry of cadmium telluride by XPS
- 1. Analytical Chemistry Div., B.A.R.C., Bombay (India)
Description
The stoichiometry of cadmium telluride has been determined by the non-destructive technique of XPS. The determination has been based on differential photoionisation cross-sections, electron mean free paths and areas due to M5 electrons of Cd and Te. The stoichiometry of Cd and Te determined by XPS has been found to be in good agreement with that obtained by analysing Cd and Te independently by chemical methods. (orig.)
Additional details
Publishing Information
- Journal Title
- Fresenius' Journal of Analytical Chemistry
- Journal Volume
- 343
- Journal Issue
- 12
- Journal Page Range
- p. 879-880.
- ISSN
- 0937-0633
- CODEN
- FJACES
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 24000685
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CADMIUM TELLURIDES; PHOTOELECTRON SPECTROSCOPY; SEMICONDUCTOR MATERIALS; STOICHIOMETRY; X RADIATION
- Descriptors DEC
- CADMIUM COMPOUNDS; CHALCOGENIDES; ELECTROMAGNETIC RADIATION; ELECTRON SPECTROSCOPY; IONIZING RADIATIONS; MATERIALS; RADIATIONS; SPECTROSCOPY; TELLURIDES; TELLURIUM COMPOUNDS