Some preliminary observations on isotope dilution secondary ion mass spectrometry: comparison with isotope dilution spark source mass spectrometry

The applicability of the SIMS technique to perform ID measurements was evaluated. Three different examples are given and the results from ID-SIMS are compared with those obtained by applying ID-SSMS. ID-SIMS can yield very accurate and precise results, provided the analyses are performed in optimal conditions; i.e. when interfering ions on the analytically important ions are absent, or when the elements to be determined are present at sufficiently high concentration levels