Published April 2, 1999
| Version v1
Journal article
PIXE and RBS as a tool for the analysis of historic copper halfpennies
Description
RBS and PIXE microbeam analysis is used to investigate the trace element concentrations as well as the surface corrosion of counterfeited copper halfpennies from the mid 18th century. PIXE elemental mapping was used to identify regions with a minimum of light element contamination which could be used for accurate trace element determinations. RBS analysis of selected points on the map could be used to confirm the absence of corrosion or contamination, and in addition yielded valuable information on the composition and structure of the corrosion layers
Additional details
Identifiers
- PII
- S0168583X98009203;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 150
- Journal Issue
- 1-4
- Journal Page Range
- p. 651-655
- ISSN
- 0168-583X
- CODEN
- NIMBEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Syrian Arab Republic
- INIS RN
- 33046097
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Descriptors DEI
- BACKSCATTERING; CHEMICAL COMPOSITION; CONCENTRATION RATIO; COPPER; CORROSION; CULTURAL OBJECTS; ELEMENTS; PIXE ANALYSIS; RUTHERFORD SCATTERING; SURFACES; TRACE AMOUNTS
- Descriptors DEC
- CHEMICAL ANALYSIS; CHEMICAL REACTIONS; ELASTIC SCATTERING; ELEMENTS; METALS; NONDESTRUCTIVE ANALYSIS; SCATTERING; TRANSITION ELEMENTS; X-RAY EMISSION ANALYSIS
Optional Information
- Copyright
- Copyright (c) 1999 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.