Published July 2010
| Version v1
Journal article
Application of the Monte Carlo method for the calibration of an in situ gamma spectrometer
- 1. Institute of Nuclear Technology and Radiation Protection, NCSR 'Demokritos', P.O.B. 60228, 15310 Aghia Paraskevi, Attikis (Greece)
- 2. School of Applied Mathematical and Physical Science, National Technical University of Athens, 15780 CityAthens (Greece)
Description
A MCNP model was developed for the efficiency calibration of an in situ gamma ray spectrometry system based on a high purity germanium (HPGe) detector. The detector active crystal volume was adjusted semi-empirically against experimental measurements. Calculated full energy peak efficiency curves, over the photon energy range between 50 keV and 5 MeV, are presented for surface and slab source configurations. The effect of different collimator apertures and the contribution of different HPGe crystal regions in the detector response are also shown.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.apradiso.2009.11.023Additional details
Identifiers
- DOI
- 10.1016/j.apradiso.2009.11.023;
- PII
- S0969-8043(09)00712-X;
Publishing Information
- Journal Title
- Applied Radiation and Isotopes
- Journal Volume
- 68
- Journal Issue
- 7-8
- Journal Page Range
- p. 1441-1444
- ISSN
- 0969-8043
- CODEN
- ARISEF
Conference
- Title
- 17. international conference on radionuclide metrology and its applications
- Acronym
- ICRM 2009
- Dates
- 7-11 Sep 2009
- Place
- Bratislava (Slovakia)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 42012678
- Subject category
- S07: ISOTOPES AND RADIATION SOURCES;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CALIBRATION; COMPUTERIZED SIMULATION; EFFICIENCY; GAMMA SPECTROMETERS; GAMMA SPECTROSCOPY; HIGH-PURITY GE DETECTORS; KEV RANGE 100-1000; KEV RANGE 10-100; MEV RANGE 01-10; MONTE CARLO METHOD; PHOTONS; SLABS; SURFACES
- Descriptors DEC
- BOSONS; CALCULATION METHODS; ELEMENTARY PARTICLES; ENERGY RANGE; GE SEMICONDUCTOR DETECTORS; KEV RANGE; MASSLESS PARTICLES; MEASURING INSTRUMENTS; MEV RANGE; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SIMULATION; SPECTROMETERS; SPECTROSCOPY
Optional Information
- Copyright
- Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.