Published July 2006
| Version v1
Journal article
3D microstructural characterization of nickel superalloys via serial-sectioning using a dual beam FIB-SEM
- 1. Air Force Research Laboratory, Materials and Manufacturing Directorate, Wright-Patterson AFB, OH 45433 (United States)
- 2. Ohio State University, Department of Materials Science and Engineering, Columbus, OH 43210 (United States)
Description
Dual beam focused ion beam-scanning electron microscopes are well suited for characterizing micron and sub-micron size microstructural features in three dimensions via serial-sectioning procedures. Importantly, these commercially-available instruments can be used to collect morphological, crystallographic, and chemical information throughout a serial-sectioning experiment. Selected examples are shown to demonstrate these capabilities
Additional details
Identifiers
- DOI
- 10.1016/j.scriptamat.2006.02.039;
- PII
- S1359-6462(06)00156-4;
Publishing Information
- Journal Title
- Scripta Materialia
- Journal Volume
- 55
- Journal Issue
- 1
- Journal Page Range
- p. 23-28
- ISSN
- 1359-6462
- CODEN
- SCMAF7
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38062137
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CRYSTALLOGRAPHY; HEAT RESISTING ALLOYS; ION BEAMS; MICROSTRUCTURE; NICKEL; SCANNING ELECTRON MICROSCOPY
- Descriptors DEC
- ALLOYS; BEAMS; ELECTRON MICROSCOPY; ELEMENTS; HEAT RESISTANT MATERIALS; MATERIALS; METALS; MICROSCOPY; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.