Stoichiometry of tetragonal and hexagonal FexSe: phase relations
- 1. Institute for Future Environments and Science and Engineering Faculty, Queensland University of Technology, 2 George St., Brisbane QLD 4001 (Australia)
Description
Precise compositional analyses at spatial resolution <1 μm, combined with structure determination using bulk (i.e. powder XRD) and individual grain (i.e. EBSD) techniques, show that both β-FexSe and δ-FexSe form as solids in a two-phase field above and below the apparent peritectic temperature of 457 °C. Microstructures show that β-FexSe and δ-FexSe form together via exsolution when cooled from this two-phase field; evident when annealing time and temperature are optimised. Using a facile one-pot method with elemental Fe:Se reactant ratios ranging from 0.95 to 1.14, β-FexSe occurs as the predominant phase in association with hexagonal δ-FexSe in the temperature range 330 °C < Tmax < 750 °C, where Tmax is the sintering temperature. Maximum yield of β-FexSe occurs after sintering at Tmax > 690 °C with annealing at 420 °C for ∼24 h. We define a modified phase diagram that includes this two phase field with β-FexSe and δ-FexSe for 1.02 < x < 0.90 and a second two phase field with β-FexSe and α-Fe for 1.08 < x < 1.02. This revised phase diagram for Fe:Se ∼ 1.0 suggests that the peretectic transition nominally identified at x = 1.04 is not evident. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1361-6668/ab89ecAdditional details
Identifiers
Publishing Information
- Journal Title
- Superconductor Science and Technology
- Journal Volume
- 33
- Journal Issue
- 7
- Journal Page Range
- [13 p.]
- ISSN
- 0953-2048
- CODEN
- SUSTEF
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 52057779
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ANNEALING; BACKSCATTERING; ELECTRON DIFFRACTION; MICROSTRUCTURE; PHASE DIAGRAMS; SINTERING; SPATIAL RESOLUTION; STOICHIOMETRY; TEMPERATURE RANGE 0400-1000 K; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; DIAGRAMS; DIFFRACTION; FABRICATION; HEAT TREATMENTS; INFORMATION; RESOLUTION; SCATTERING; TEMPERATURE RANGE