Published 1985
| Version v1
Book
Time-of-flight systems for heavy ions
Description
This chapter describes the use of time-of-flight (TOF) systems to determine the mass of heavy ions. Topics considered include general considerations of time-of-flight measurements (capabilities and limitations), timing detectors (surface barrier detectors, scintillation detectors, secondary electron emission detectors, parallel plate avalanche counters, low-pressure noble gas scintillator counters, pulsed-bunched ion beams), and time-of-flight arrangements (the standard TOF, TOF used in magnetic spectrometers)
Additional details
Publishing Information
- Publisher
- Plenum Press.
- Imprint Place
- New York, NY (USA)
- Imprint Title
- Treatise on heavy-ion science: Vol. 7. Instrumentation and techniques
- Journal Page Range
- p. 275-332.
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 17045325
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S74: ATOMIC AND MOLECULAR PHYSICS; S73: NUCLEAR PHYSICS AND RADIATION PHYSICS;
- Descriptors DEI
- HEAVY IONS; ION BEAMS; MAGNETIC SPECTROMETERS; MASS SPECTROSCOPY; SCINTILLATION COUNTERS; SECONDARY EMISSION DETECTORS; SURFACE BARRIER DETECTORS; TIME-OF-FLIGHT METHOD; TIME-OF-FLIGHT SPECTROMETERS
- Descriptors DEC
- BEAMS; CHARGED PARTICLES; IONS; MEASURING INSTRUMENTS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SPECTROMETERS; SPECTROSCOPY