PIXE-PIGME studies of artefacts

A system is described for simultaneous measurements of proton induced X-rays (PIXE) and gamma rays (PIGME) as an automated analysis system. Complete artefacts are mounted so as to minimize variations in position and angle of the irradiated surface, but no other special preparation is necessary. More than 20 elements are determined from X-ray and γ-ray intensities and the results are filed for statistical tests and comparisons with appropriate source material. Measurements on obsidian, pottery, metal and other material show that the data are useful for sample characterization provided that weathering and other surface anomalies are not too severe. (orig.)