Published 1974 | Version v1
Journal article Metadata-only

Interstitial properties deduced from internal friction measurements on boron-implanted silicon

Creators

  • 1. Max-Planck-Institut fuer Metallforschung, Stuttgart (F.R. Germany). Inst. fuer Physik

Description

no abstract available

Additional details

Identifiers

DOI
10.1080/10420157408230820;

Publishing Information

Journal Title
Radiation Effects
Journal Volume
21
Journal Issue
2
Series
Radiat. Eff.
Journal Page Range
119-133
ISSN
0033-7579

INIS

Country of Publication
United Kingdom
Country of Input or Organization
United Kingdom
INIS RN
5149345
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
ACTIVATION ENERGY; ATOMS; BORON; BORON IONS; CRYSTAL LATTICES; DIFFUSION; ELECTRIC CHARGES; INTERNAL FRICTION; INTERSTITIALS; ION IMPLANTATION; ORIENTATION; SEMICONDUCTOR MATERIALS; SILICON
Descriptors DEC
CHARGED PARTICLES; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; ELEMENTS; ENERGY; FRICTION; IONS; POINT DEFECTS; SEMIMETALS

Optional Information

Notes
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