Computational code for track etch profile determination

The track profile evolution in a nuclear track detector during the etching process can be analyzed by applying the variational principle. The LELE program outlined here calculates the least time trajectories for a specific ion at a given etching time. The calculations are based on the formulae obtained by previous authors. The code produces onscreen images of etching trajectories on any PC compatible computer equipped with a CGA graphics card. (author)