Published 1993
| Version v1
Journal article
Optical constants of Ni/Si O thin cermet films determined by ellipsometry
Creators
- 1. Institute of Physics, Faculty of Natural Sciences and Mathematics, St. Cyril and Methodius University, Skopje (Macedonia, The Former Yugoslav Republic of)
Description
Ellipsometric measurements were employed for the determination of the optical constants and the thickness of the thin Ni/Si O cermet films, using MAI method (Multiple Angles of Incidence). The films which have been studied in this work, were prepared by alternate vacuum deposition and each had different volume fraction of Ni. The determined values of n and k were compared with those predicted by Maxwell-Garnett and Bruggeman theories. (author)
Additional details
Additional titles
- Original title (Macedonian)
- Opredeluvanje na optichki konstanti na Ni/Si O kermetni tenki filmovi so elipsometriski metod
Publishing Information
- Journal Title
- Godishen Zbornik. Fizika - Prirodno Matematichki Fakultet na Univerzitetot 'Kiril i Metodij' Skopje. Institut za Fizika
- Journal Volume
- 43-44
- Journal Page Range
- p. 17-25.
- ISSN
- 0352-9649
INIS
- Country of Publication
- North Macedonia, Republic of
- Country of Input or Organization
- North Macedonia, Republic of
- INIS RN
- 29031028
- Subject category
- S36: MATERIALS SCIENCE; S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Numerical Data
- Descriptors DEI
- CERMETS; ELLIPSOMETRY; EXPERIMENTAL DATA; NICKEL; OPTICAL PROPERTIES; PHYSICAL VAPOR DEPOSITION; SILICON OXIDES; THIN FILMS; VACUUM EVAPORATION
- Descriptors DEC
- CHALCOGENIDES; COMPOSITE MATERIALS; DATA; DEPOSITION; ELEMENTS; EVAPORATION; FILMS; INFORMATION; MATERIALS; MEASURING METHODS; METALS; NUMERICAL DATA; OXIDES; OXYGEN COMPOUNDS; PHASE TRANSFORMATIONS; PHYSICAL PROPERTIES; SILICON COMPOUNDS; SURFACE COATING; TRANSITION ELEMENTS
Optional Information
- Notes
- 11 refs., 5 figs.