Published September 2012
| Version v1
Journal article
Blind backscattering experimental data collected in the field and an approximately globally convergent inverse algorithm
Creators
- 1. Morgan Stanley and Co. Incorporated, 1585 Broadway, New York, NY 10036 (United States)
- 2. Department of Mathematical Sciences, Chalmers University of Technology and Gothenburg University, SE-42196 Gothenburg (Sweden)
- 3. Department of Mathematics and Statistics, University of North Carolina at Charlotte, Charlotte, NC 28223 (United States)
- 4. US Army Research Laboratory, 2800 Powder Mill Road Adelphy, MD 20783-1197 (United States)
- 5. Optoelectronics Center, University of North Carolina at Charlotte, Charlotte, NC 28223 (United States)
Description
An approximately globally convergent numerical method for a 1D coefficient inverse problem for a hyperbolic PDE is applied to image dielectric constants of targets from blind experimental data. The data were collected in the field by the Forward Looking Radar of the US Army Research Laboratory. A posteriori analysis has revealed that computed and tabulated values of dielectric constants are in good agreement. Convergence analysis is presented. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/0266-5611/28/9/095007Additional details
Identifiers
Publishing Information
- Journal Title
- Inverse Problems
- Journal Volume
- 28
- Journal Issue
- 9
- Journal Page Range
- [33 p.]
- ISSN
- 0266-5611
- CODEN
- INVPET
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45035550
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Descriptors DEI
- ALGORITHMS; APPROXIMATIONS; BACKSCATTERING; CONVERGENCE; IMAGES; INVERSE SCATTERING PROBLEM; NUMERICAL ANALYSIS; PARTIAL DIFFERENTIAL EQUATIONS; PERMITTIVITY; RADAR
- Descriptors DEC
- CALCULATION METHODS; DIELECTRIC PROPERTIES; DIFFERENTIAL EQUATIONS; ELECTRICAL PROPERTIES; EQUATIONS; MATHEMATICAL LOGIC; MATHEMATICS; MEASURING INSTRUMENTS; PHYSICAL PROPERTIES; RANGE FINDERS; SCATTERING