Temperature-dependent magnetization, anisotropy and conductivity of CoFe2−x Snx O4 ( x = 0.025, 0.05, 0.075): appearance of grain boundary conductivity at high temperatures
- 1. Advanced Magnetic Materials Laboratory, Department of Physics, Indian Institute of Technology Madras, Chennai 600036 (India)
- 2. Research and Development Centre, Bharathiar University, Coimbatore 641046 (India)
- 3. Department of Chemistry, Philipps University of Marburg, Marburg 35032 (Germany)
- 4. Post Graduate and Research Department of Physics, The American College, Madurai 625002 (India)
- 5. Materials Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20899 (United States)
Description
The temperature dependence of magnetization, anisotropy, ac and dc conductivity of CoFe2−x Snx O4 ( x = 0.025, 0.05, 0.075) were investigated and the results are reported. All the compounds were prepared by a solid-state reaction, and the formation of the compounds in the cubic inverse spinel phase was confirmed from their Rietveld refined x-ray diffraction (XRD) patterns and Raman spectra. Increments in the lattice constant were observed upon the partial substitution of Fe3+ by Sn4+. The presence of all elements and their ionic states were confirmed from x-ray photoelectron spectroscopic studies. Magnetic hysteresis loops were measured for each compound at temperature 20 K and 50–300 K (in steps of 50 K) using a superconducting quantum interference device vibrating sample magnetometer. Both magnetization and magnetic anisotropy showed a decrease in values with increasing Sn substitution. Room temperature (RT) magnetization is seen to decrease from 80–65.91 emu g−1 with increasing Sn concentration from x = 0 (CoFe2O4) to 0.075 (CoFe1.925Sn0.075O4). The high field regimes of the hysteresis loops were modeled using the law of approach to the saturation magnetization equation. The temperature variation of magnetization and magnetic anisotropy are explained on the basis of a one-ion model. Complex impedance spectroscopy studies at RT show that the conductivity in these materials is predominantly due to the intrinsic bulk grains. With increasing the temperature, evolution of the grain boundary conduction is clearly seen through the appearance of a second semi-circle in the complex impedance plots. The RT total dc conductivity value of CoFe2−x Snx O4 ( x = 0, 0.025, 0.05, 0.075) is found to be 5.78 × 10−8, 8.56 × 10−8, 1.44 × 10−7 and 1.11 × 10−7 S cm−1 respectively. The observation of well-distinguishable grain and grain boundary conductions and the low conductivity values in the CoFe2−x Snx O4 ( x = 0, 0.025) materials indicates that these materials are promising candidates for high-frequency applications. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/0022-3727/49/30/305001Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. D, Applied Physics
- Journal Volume
- 49
- Journal Issue
- 30
- Journal Page Range
- [10 p.]
- ISSN
- 0022-3727
- CODEN
- JPAPBE
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 49018850
- Subject category
- S36: MATERIALS SCIENCE; S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Descriptors DEI
- ANISOTROPY; GRAIN BOUNDARIES; INTERFERENCE; IRON IONS; LATTICE PARAMETERS; MAGNETIZATION; PHOTOELECTRON SPECTROSCOPY; RAMAN SPECTRA; SQUID DEVICES; TEMPERATURE DEPENDENCE; TEMPERATURE RANGE 0273-0400 K; TEMPERATURE RANGE 0400-1000 K; VIBRATING SAMPLE MAGNETOMETERS; X-RAY DIFFRACTION
- Descriptors DEC
- CHARGED PARTICLES; COHERENT SCATTERING; DIFFRACTION; ELECTRON SPECTROSCOPY; ELECTRONIC EQUIPMENT; EQUIPMENT; FLUXMETERS; IONS; MAGNETOMETERS; MEASURING INSTRUMENTS; MICROSTRUCTURE; MICROWAVE EQUIPMENT; SCATTERING; SPECTRA; SPECTROSCOPY; SUPERCONDUCTING DEVICES; TEMPERATURE RANGE