Published 1995
| Version v1
Journal article
Synchrotron x-ray microbeam characteristics for x-ray fluorescence analysis
Creators
- 1. National Laboratory for High Energy Physics, Ibaraki (Japan)
Description
X-ray fluorescence analysis using a synchrotron x-ray microprobe has become an indispensable technique for non-destructive micro-analysis. One of the most important parameters that characterize the x-ray microbeam system for x-ray fluorescence analysis is the beam size. For practical analysis, however, the photon flux, the energy resolution and the available energy range are also crucial. Three types of x-ray microbeam systems, including monochromatic and continuum excitation systems, were compared with reference to the sensitivity, the minimum detection limit and the applicability to various types of x-ray spectroscopic analysis. 16 refs., 5 figs
Additional details
Publishing Information
- Journal Title
- Advances in X-Ray Analysis
- Journal Volume
- 38
- Journal Page Range
- p. 283-289.
- ISSN
- 0376-0308
- CODEN
- AXRAAA
Conference
- Title
- 43. annual Denver x-ray conference on applications of x-ray analysis.
- Dates
- 1-5 Aug 1994.
- Place
- Steamboat Spring, CO (United States).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 27073890
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BEAM PROFILES; MEASURING METHODS; MICROANALYSIS; PHOTON BEAMS; SYNCHROTRON RADIATION; X-RAY FLUORESCENCE ANALYSIS
- Descriptors DEC
- BEAMS; BREMSSTRAHLUNG; CHEMICAL ANALYSIS; ELECTROMAGNETIC RADIATION; NONDESTRUCTIVE ANALYSIS; RADIATIONS; X-RAY EMISSION ANALYSIS
Optional Information
- Secondary number(s)
- CONF-9408178--.