Published November 1, 2002 | Version v1
Journal article

GRANFILM: a software for calculating thin-layer dielectric properties and Fresnel coefficients

Description

This paper describes new software--called GRANFILM--for computing linear optical coefficients for surfaces and thin layers. The underlying theory relies on the treatment of the electromagnetic boundary conditions at the surface using the notions of integrated electromagnetic excess fields and surface susceptibilities. Any type of Fresnel quantities (reflection, transmission, absorption or ellipsometric coefficients) and dielectric coefficients (energy electron loss cross-section) can be computed by this software for various kinds of surface morphology: thin continuous films, island layers made of truncated spheres or spheroids, or rough surfaces. The only restriction on the morphology is that the thickness of the surface perturbed layer is much smaller than the optical wavelength. GRANFILM covers most of the material developed by Bedeaux and Vlieger in the recently published book 'Optical Properties of Surfaces' (Imperial College Press, London, 2001)

Additional details

Identifiers

PII
S004060900200679X;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
419
Journal Issue
1-2
Journal Page Range
p. 124-136
ISSN
0040-6090
CODEN
THSFAP

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
37001448
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
BOUNDARY CONDITIONS; COMPUTER CODES; DIELECTRIC MATERIALS; DIELECTRIC PROPERTIES; FRESNEL COEFFICIENT; LAYERS; OPTICAL PROPERTIES; SURFACES; THIN FILMS
Descriptors DEC
ELECTRICAL PROPERTIES; FILMS; MATERIALS; PHYSICAL PROPERTIES

Optional Information

Copyright
Copyright (c) 2002 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.