A Simple Approach of Presampled Modulation Transfer Function Measurement Tested on the Phoenix Nanotom Scanner
Creators
- 1. Master student at Institute of Physics and Technology, Tomsk Polytechnic University, Tomsk (Russian Federation)
- 2. Junior researcher at Institute of Nondestructive Testing, Tomsk Polytechnic University, Tomsk (Russian Federation)
- 3. Research engineer at Institute of Nondestructive Testing, Tomsk Polytechnic University, Tomsk (Russian Federation)
Description
In this paper presampled modulation transfer function of the 2D images obtained on the Phoenix Nanotom scanner was investigated with different measurement set-ups. Three parameters were chosen to investigate their influence on modulation transfer function: source- detector distance, tube current and binning mode. A simple method for modulation transfer function determination of digital imaging detectors from edge images was applied. The following results were achieved and briefly discussed: modulation transfer function improves with increase of the source-detector distance, slightly improves with increase of the current and remains constant for different binning modes. All measurements were carried out in University of Applied Sciences Upper Austria at Wels campus. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1742-6596/671/1/012021Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Conference Series (Online)
- Journal Volume
- 671
- Journal Issue
- 1
- Journal Page Range
- [6 p.]
- ISSN
- 1742-6596
Conference
- Title
- 3. all-Russian scientific and practical conference on innovations in non-destructive testing
- Acronym
- SibTest 2015
- Dates
- 27-31 Jul 2015
- Place
- Altai (Russian Federation)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 47112980
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ELECTRIC CURRENTS; IMAGES; MODULATION; TRANSFER FUNCTIONS; TUBES
- Descriptors DEC
- CURRENTS; FUNCTIONS