Ray tracing/correlation approach to estimation of surface-based duct parameters from radar clutter
Creators
- 1. Institute of Meteorology, PLA University of Science and Technology Nanjing 211101 (China)
Description
This paper describes a technique to estimate surface-based duct parameters by using a simple ray tracing/correlation method. The approach is novel in that it incorporates the Spearman rank-order correlation scheme between the observed surface clutter and the surface ray density for a given propagation path. The simulation results and the real data results both demonstrate the ability of this method to estimate surface-based duct parameters. Compared with the results obtained by a modified genetic algorithm combined with the parabolic wave equation, the results retrieved from the ray tracing/correlation scheme show a minor reduction in accuracy but a great improvement on computation time. Therefore the ray tracing/correlation method might be used as a precursor to more sophisticated and slower techniques, such as genetic algorithm and particle filters, by narrowing the parameter search space and providing a comprehensive and more efficient estimation algorithm. (geophysics, astronomy and astrophysics)
Availability note (English)
Available from http://dx.doi.org/10.1088/1674-1056/19/4/049201Additional details
Identifiers
Publishing Information
- Journal Title
- Chinese Physics. B
- Journal Volume
- 19
- Journal Issue
- 4
- Journal Page Range
- [8 p.]
- ISSN
- 1674-1056
INIS
- Country of Publication
- China
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45009504
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Descriptors DEI
- ALGORITHMS; CALCULATION METHODS; COMPARATIVE EVALUATIONS; COMPUTERIZED SIMULATION; CORRELATIONS; DENSITY; DUCTS; RADAR; SURFACES; WAVE EQUATIONS
- Descriptors DEC
- DIFFERENTIAL EQUATIONS; EQUATIONS; EVALUATION; MATHEMATICAL LOGIC; MEASURING INSTRUMENTS; PARTIAL DIFFERENTIAL EQUATIONS; PHYSICAL PROPERTIES; RANGE FINDERS; SIMULATION