The use of transparent indium-zinc oxide/(oxidized-Ni/Au) ohmic contact to GaN-based light-emitting diodes for light output improvement
- 1. Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University, Tainan 701, Taiwan (China)
- 2. Department of Computer Science and Information Engineering, WuFeng Institute of Technology, Chiayi 621, Taiwan (China)
Description
In this study, a low-resistant and high-transparent ohmic contact to p-GaN layer using an indium-zinc oxide (IZO)/(oxidized-Ni/Au) contact system was investigated to enhance light extraction of GaN-based light-emitting diodes (LEDs). Improvement in the light output of GaN-based blue LEDs as a function of the IZO film thickness was examined and an optimum thickness of around 300 nm has been found. Under an injection current in the 10-50 mA range, as compared to the case without IZO film, about 35-28% improvement in light output power (Lop) has been obtained. Comparisons of Lop and its reliability for LEDs with an IZO or indium-tin oxide transparent conduction layer were also made. In addition, compared to IZO/GaN samples without the patterned surface, the LEDs fabricated using a patterned IZO surface show a 23.1% improvement in Lop at 20 mA
Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2006.07.171;
- PII
- S0040-6090(06)00903-5;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 515
- Journal Issue
- 4
- Journal Page Range
- p. 2501-2506
- ISSN
- 0040-6090
- CODEN
- THSFAP
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38058232
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- FILMS; GALLIUM NITRIDES; INDIUM OXIDES; LAYERS; LIGHT EMITTING DIODES; TIN OXIDES; ZINC OXIDES
- Descriptors DEC
- CHALCOGENIDES; GALLIUM COMPOUNDS; INDIUM COMPOUNDS; NITRIDES; NITROGEN COMPOUNDS; OXIDES; OXYGEN COMPOUNDS; PNICTIDES; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; TIN COMPOUNDS; ZINC COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.