Published January 1, 1980
| Version v1
Journal article
Measurement of the size dependence of the current-phase relation in microbridge Josephson junctions
Creators
- 1. Department of Physics, State University of New York, Stony Brook, New York 11794
Description
We present the first direct measurements of the size effect on the current-phase relation of microbridge Josephson junctions. The phase difference across the bridge is obtained by subtracting the phase shift of the thin-film leads from the total phase shift. We have found that the current-phase relations are sinusoidal for both uniform and variable thickness bridges with dimensions much smaller than xi (T). For narrow uniform thickness bridges with width very-much-less-thanxi (T), the measured length dependence of the current-phase relation is in good agreement with the calculation of Likharev and Yakobson for variable thicknes bridges
Additional details
Publishing Information
- Journal Title
- Appl. Phys. Lett.
- Journal Volume
- 36
- Journal Issue
- 1
- Series
- Appl. Phys. Lett.
- Journal Page Range
- 88-90
- ISSN
- 0003-6951
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 11522544
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- COMPARATIVE EVALUATIONS; DATA; ELECTRIC BRIDGES; ELECTRIC CURRENTS; FILMS; JOSEPHSON JUNCTIONS; MATHEMATICAL MODELS; PHASE SHIFT; THICKNESS
- Descriptors DEC
- CURRENTS; DIMENSIONS; ELECTRICAL EQUIPMENT; INFORMATION; SEMICONDUCTOR JUNCTIONS