Formation and morphology of the intermetallic compounds formed at the 91Sn-8.55Zn-0.45Al lead-free solder alloy/Cu interface
Creators
- 1. Department of Materials Science and Engineering, National United University, 1 Lien-Da, Kung-Ching Li, Miao-Li 36003, Taiwan (China) and Department of Mechanical Engineering, National Kaohsiung University of Applied Sciences, 415 Chien-Kung Road, Kaohsiung 80782, Taiwan (China)
- 2. Department of Materials Science and Engineering, National Cheng Kung University, 1 Ta-Hsueh Road, Tainan 70101, Taiwan (China)
Description
Formation and morphology of the intermetallic compounds (IMCs) formed at the 91Sn-8.55Zn-0.45Al lead-free solder alloy/Cu interface has been studied using X-ray diffraction (XRD), scanning electron microscopy (SEM), transmission electron microscopy (TEM) and electron diffraction (ED). The XRD analysis indicates that the γ-Cu5Zn8 IMC is found at the solder/Cu interface in the as-wetted sample. When heat treated at 423 K for 100 or 400 h, the IMC phases still remain as γ-Cu5Zn8 and Cu6Sn5. As the aging time increases from 400 to 1000 h, besides γ-Cu5Zn8 and Cu6Sn5, γ'-Cu9Al4 also appears. Planar-shaped γ-Cu5Zn8 and Cu6Sn5 are found near the solder and the Cu substrate, respectively. However, scallop-shaped γ-Cu5Zn8 is found at the eutectic 91Sn-8.55Zn-0.45Al solder alloy/Cu interface when aged at 423 K
Additional details
Identifiers
- DOI
- 10.1016/j.jallcom.2004.08.009;
- PII
- S0925-8388(04)01014-X;
Publishing Information
- Journal Title
- Journal of Alloys and Compounds
- Journal Volume
- 389
- Journal Issue
- 1-2
- Journal Page Range
- p. 133-139
- ISSN
- 0925-8388
- CODEN
- JALCEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37039421
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ALUMINIUM ALLOYS; COPPER; ELECTRON DIFFRACTION; EUTECTICS; HEAT TREATMENTS; INTERFACES; INTERMETALLIC COMPOUNDS; SCANNING ELECTRON MICROSCOPY; SUBSTRATES; TEMPERATURE RANGE 0400-1000 K; TIN ALLOYS; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION; ZINC ALLOYS
- Descriptors DEC
- ALLOYS; COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; ELEMENTS; METALS; MICROSCOPY; SCATTERING; TEMPERATURE RANGE; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.