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AbstractAbstract
[en] Auger electron spectroscopy (A.E.S.) allows to characterize the atoms lying at surfaces of amorphous and crystalline materials and to investigate their chemical bond. In the case of single crystals it is generally associated with LEED which gives information on the surface structure. After having recalled some principles about radiationless deexcitation of atoms and the related Auger transitions, the problems of interpretation of energy spectra in the case of a single atom and their of an atom bound to neighbours either of the same kind or of a different one, are discussed. Some applications of A.E.S. as an analytical method are finally described
[fr]
La spectrometrie des electrons Auger permet de caracteriser les atomes situes a la surface d'un corps cristallin ou amorphe et de preciser la nature de leurs liaisons. Dans le cas de monocristaux elle est en general associee a la diffraction des electrons lents, ce qui permet d'avoir, en plus des renseignements sur la structure de la surface. Apres un rappel de la desexcitation non radiative des atomes et des transitions Auger correspondantes, les problemes que souleve l'interpretation des spectres d'energie sont traites d'abord dans le cas d'un atome isole puis dans celui d'un atome lie a des atomes voisins de meme espece ou d'especes differentes. On examine enfin quelques applications de l'analyse AugerOriginal Title
Spectrometrie des electrons Auger
Source
Colloquium on recent methods for solids analysis; Dijon, France; 30 Jun 1975
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Journal Article
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Conference
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Revue de Physique Appliquee; v. 11(1); p. 13-21
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AbstractAbstract
[en] The composition of the surface of a solid body is generally different from that of the bulk. There are many problems that cannot be solved simply by an analysis of the elements, information on the binding states of the detected elements, or rather on the molecules, being required also. The results obtainable depend on the nature of the problem. Where general surface analysis is concerned, e.g. in the areas of corrosion, catalysis, and high polymer technology, ESCA permits substantial characterization of the binding states. SIMS is opening up new opportunities in the use of surfaces and surface analysis methods to identify and investigate the structures of small quantities of substances. In model experiments under idealized conditions (performed by UPS and ELS, for example) it is possible to arrive at fundamental conclusions regarding the adsorbate/substrate interaction. (orig.)
[de]
Ein Festkoerper ist an seiner Oberflaeche in der Regel anders zusammengesetzt als im Volumen. Bei zahlreichen Fragestellungen genuegt die Elementanalyse nicht; es werden Angaben zum Bindungszustand der nachgewiesenen Elemente, besser noch Aussagen ueber Molekuele gefordert. Die erzielbaren Ergebnisse haengen von der Problemstellung ab. In der allgemeinen Oberflaechenanalytik, z.B. in den Bereichen Korrosion, Katalyse, Hochpolymertechnologie gestattet ESCA eine weitreichende Charakterisierung der Bindungsverhaeltnisse. Beim Gebrauch der Oberflaeche und der Oberflaechenanalysenmethoden zur Identifizierung und Strukturaufklaerung geringer Substanzmengen weist SIMS neue Wege. In Modellversuchen unter idealisierten Voraussetzungen koennen grundlegende Aussagen zur Wechselwirkung Adsorbat/Substrat z.B. mit UPS und ELS gewonnen werden. (orig.)Original Title
Molekuelspektroskopie an Oberflaechen - Nachweis von Bindungsverhaeltnissen und Molekuelen im Monolagenbereich
Primary Subject
Source
Work-meeting on applied molecular spectroscopy; Dortmund, Germany, F.R; 24 - 27 Nov 1981
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Journal Article
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G-I-T (Glas- Instrum.-Tech.) Fachz. Lab; ISSN 0016-3538;
; v. 26(1); p. 13-27

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Wiese, Joss; Trippel, Sebastian; Küpper, Jochen, E-mail: joss.wiese@desy.de2015
AbstractAbstract
No abstract available
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Source
ICPEAC2015: 29. international conference on photonic, electronic, and atomic collisions; Toledo (Spain); 22-28 Jul 2015; Available from http://dx.doi.org/10.1088/1742-6596/635/11/112139; Abstract only; Country of input: International Atomic Energy Agency (IAEA)
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Journal Article
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Journal of Physics. Conference Series (Online); ISSN 1742-6596;
; v. 635(11); [1 p.]

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AbstractAbstract
[en] Published in summary form only
Original Title
Aplicacoes das tecnicas de analise de superficie em estudos sobre ceramicas
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32. Brazilian Congress on Ceramic; Natal, RN (Brazil); 24-27 Apr 1988
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Journal Article
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Zhang, Z.; Len, Patrick; Kaduwela, A.; Thevuthasan, Suntharampillai; Van Hove, Michel A.; Fadley, Charles S.
Ernest Orlando Lawrence Berkeley National Lab., Advanced Light Source, Berkeley, CA (United States). Funding organisation: US Department of Energy (United States)1995
Ernest Orlando Lawrence Berkeley National Lab., Advanced Light Source, Berkeley, CA (United States). Funding organisation: US Department of Energy (United States)1995
AbstractAbstract
No abstract available
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Source
1 Oct 1995; [vp.]; 42. National Symposium of the American Vacuum Society; Minneapolis, MN (United States); 16-20 Oct 1995; AC03-76SF00098; Available from (additional information): www.als.lbl.gov/
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Nekoogar, F.; Dowla, F., E-mail: nekoogar1@llnl.gov
Symposium on International Safeguards: Linking Strategy, Implementation and People. Book of Abstracts, Presentations and Papers2015
Symposium on International Safeguards: Linking Strategy, Implementation and People. Book of Abstracts, Presentations and Papers2015
AbstractAbstract
[en] The ability to reliably and securely automate the monitoring of SNM is an important goal in Safeguards. Although item level monitoring of SNM requires both seal and tag technologies, the two technologies thus far have been developed more or less independently, and had been a lack of an integrated compact system. An integrated seal-and-tag approach not only aids inspectors to perform their tasks effectively, this approach also allows real-time inspection in large scale facilities. A typical facility could be the size of a large warehouse with hundreds or thousands of items that need to be sealed and monitored in real-time. Previously we reported on advanced secure RF passive (battery-less) tags with special features including, long-range interrogation of passive tags, communicating with passive tags with strong encryption and dynamic authentication features, and the ability to place the tags directly on metal objects. In this paper, we report on a novel secure passive tag integrated with fibre optics seal that allows real-time monitoring of items through secure wireless communications that employs AES encryption and dynamic authentication. Furthermore, the devices can be networked for large scale operations. The proposed passive seal has the same capabilities as active seals in that it allows realtime monitoring. However, the battery lifetimes of conventional active seals are limited or unpredictable. As the long-term storage of SNM might last for several years, these passive seals having been integrated with passive RF tags, extends the lifetime of the physical seals and tags indefinitely, while getting the same performance of active seals and tags. The integrated seal-and-tag is transformational in addressing a critical need in Safeguards area for long-term real-time monitoring. (author)
Primary Subject
Source
International Atomic Energy Agency (IAEA), Vienna (Austria); 491 p; 23 Mar 2015; p. 298; 12. Symposium on International Safeguards: Linking Strategy, Implementation and People; Vienna (Austria); 20-24 Oct 2014; CN--220-278; S19--09; Also available on-line: http://www.iaea.org/safeguards/symposium/2014/home/eproceedings/sg2014_eproceedings_online.pdf; S19: Advanced Technologies for Safeguards Communications
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Report
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Langeron, J.P.
Microanalysis and scanning electron microscopy. Summer school, Saint-Martin-d'Heres, 11-16 Sep 19781978
Microanalysis and scanning electron microscopy. Summer school, Saint-Martin-d'Heres, 11-16 Sep 19781978
AbstractAbstract
[en] The primary electron bombardment induces the emission of back scattered or secondary electrons. Their intensity is high against that corresponding to Auger electrons. This is why Auger spectrometry extended as from 1967 only, when Harris finalized a system of energy modulation of the primary electron beam making it possible to obtain on the derived curve dN(E)/dE = f(E) a satisfactory signal to background ratio for a primary electron beam intensity in the vicinity of a microampere. It is the value of this signal to background ratio that limits the sensitivity of the Auger spectrometric system: 0.1 to 1% according to the elements
[fr]
Le bombardement electronique primaire provoque egalement l'emission d'electrons retrodiffuses ou secondaires; leur intensite est elevee devant celle correspondant aux electrons Auger. C'est pourquoi la spectrometrie Auger ne s'est developpee qu'a partir de 1967 lorsque Harris a mis au point un systeme de modulation en energie du faisceau d'electrons primaires permettant d'obtenir sur la courbe derivee dN(E)/dE = f(E) un rapport signal sur bruit satisfaisant pour une intensite du faisceau d'electrons primaires voisine du microampere. C'est la valeur de ce rapport signal sur bruit qui limite la sensibilite de la spectrometrie Auger: 0,1 a 1% selon les elementsOriginal Title
Utilisation des electrons Auger en microanalyse
Primary Subject
Source
Maurice, F.; Meny, L.; Tixier, R. (comps.); p. 503-506; 1978; p. 503-506; Editions de Physique; Orsay, France; Summer school on microanalysis and scanning electron microscopy; Saint-Martin-d'Heres, France; 11 - 16 Sep 1978
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Book
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Mansur, Herman S.; Vasconcelos, Wander L.; Grieser, Franz; Urquhart, Robert S.; Furlong, D. Neil
Proceedings of the 39. Brazilian congress on ceramics1995
Proceedings of the 39. Brazilian congress on ceramics1995
AbstractAbstract
[en] CdS 'Q-state' particles, with average diameters varying from 2 nm to 10 nm, grown in arachidic acid Langmuir-Blodgett (LB) films, deposited onto optically transparent glass electrodes (OTES), were exposed to H2 Se(g) to form the corresponding Q-state Cd Sx Se(1-x) particles. Those particles are considered to be made up of a core of CdS and coated with a monolayer of Cd Se. Q-state Cd S-x Se(1-x) particle formation was verified by X-ray photoelectron spectroscopy (XPS) and by monitoring a red shift in the UV-visible absorbance spectra relative to that of Cds. XPS results on 5 nm diameter CdS particles that had been grown in an LB film and then extensively exposed to H2 S (g) revealed a stable average composition of Cd S0.4 Se06. A study of the photoelectrochemical behaviour of these systems was conducted through current the open-circuit voltage and a marked increase in the short-circuit current was observed when LB films with Q-state CdS particles were exposed to H2 Se(g). (author)
Original Title
Propriedades fotoeletroquimicas de particulas 'Q-state'em filmes de Langmuir-Blodgett depositados sobre eletrodos de vidro opticamente transparente (OTE)
Secondary Subject
Source
Associacao Brasileira de Ceramica, Sao Paulo, SP (Brazil); 579 p; 1995; p. 125-129; 39. Brazilian congress on ceramics; 39. Congresso brasileiro de ceramica; Aguas de Lindoia, SP (Brazil); 10-13 Jun 1995; Available from the library of the Brazilian Nuclear Energy Commission, Rio de Janeiro; 4 figs.
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Miscellaneous
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AbstractAbstract
[en] After a survey of the general principles of Auger electron spectroscopy, experimental techniques and their limitations are given. Application to thin layers and light elements detection is a complement of other surace analysis methods
[fr]
Apres un rappel des principes generaux de la spectroscopie Auger, les techniques experimentales et les limitations de la methode sont donnees. L'application aux couches minces et a la detection des elements legers est complementaire des autres methodes d'analyse de surfaceOriginal Title
Spectroscopie des electrons Auger. Principes generaux, experimentation, applications
Secondary Subject
Source
Seminar on thin film analysis and characterization methods; Les Arcs/Bourg-Saint-Maurice, France; 23 - 27 Jan 1978
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Journal Article
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Vide. Couches Minces; (Suppl. no.189); p. 101-112
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Teterin, Yu. A.; Ivanov, K. E.
Proceedings; Yugoslav Nuclear Society ; Institute of Nuclear Sciences VINCA1997
Proceedings; Yugoslav Nuclear Society ; Institute of Nuclear Sciences VINCA1997
AbstractAbstract
[en] Development of precise X-ray photoelectron spectroscopy using X-ray radiation hν< 1.5 KeV allowed to carry out immediate investigations of fine spectra structure of both weakly bond and deep electrons. Based on the experiments and the obtained results it may be concluded: 1. Under favourable conditions the inner valence molecular orbitals (IVMO) may form in all actinide compounds. 2. The XPS spectra fine structure stipulated by IVMO electrons allows to judge upon the degree of participation of the filled AO electrons in the chemical bond, on the structure o considered atom close environment and the bond lengths in compounds. For amorphous compounds the obtaining of such data based on X-ray structure analysis is restricted. 3. The summary contribution of IVMO electrons to the absolute value of the chemical bonding is comparable with the corresponding value of OMO electrons contribution to the atomic bonding. This fact is very important and new in chemistry. (author)
Primary Subject
Source
Antic, D. (ed.) (Institut za Nuklearne Nauke VINCA, Belgrade (Yugoslavia)); 746 p; ISBN 86-7306-012-5;
; 1997; p. 437-448; Institute of Nuclear Sciences VINCA; Belgrade (Yugoslavia); Yugoslav Nuclear Society Conference (YUNSC'96); Jugoslovensko nuklearno drustvo konferencija, zbornik radova; Belgrade (Yugoslavia); 6-9 Oct 1996; 16 refs., 8 figs.

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