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AbstractAbstract
[en] The X ray photoelectron intensity issued from a thin film sample attached below an anode (in a sheet form) is calculated and the principles and expected performances of photoelectron microanalysis are deduced. In scanning electron microscopy, using the proposed operating conditions, it will be possible to obtain a final electronic image not only characteristic of a given element but also of its oxydation degree with a spatial resolution of about 1μ. A.E.S. and X.P.S. are compared and the schematic drawing of a versatile apparatus allowing electron induced A.E.S., X ray induced A.E.S. and X.P.S. is pointed out
[fr]
En calculant l'intensite des photoelectrons X emis par un objet ayant la forme d'un film mince et place sous une anticathode a faces paralleles, on montre qu'il est possible de conferer a la spectroscopie des photoelectrons un caractere microanalytique avec une resolution spatiale de l'ordre de 1μ. On en deduit pour le microscope a balayage un mode de fonctionnement avec lequel on obtiendrait une image specifique non seulement de la nature des elements constituant la preparation mais aussi de leur degre d'oxydation. Apres les avoir compares on indique comment l'appareil projete permet de combiner les mesures effectuees en spectrometries Auger et en ESCAOriginal Title
Microanalyse et microscopie photoelectroniques X: principe et performances previsibles
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Journal Article
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Revue de Physique Appliquee; v. 10(5); p. 263-280
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AbstractAbstract
No abstract available
Original Title
Les methodes d'analyse de surface
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Journal Article
Journal
Bull. Inf. Sci. Tech. (Paris); (no.200); p. 107-111
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AbstractAbstract
[en] A discussion is given of the types of molecular structure information available from X-ray photoelectron spectroscopy. A complete set of atomic charges in a molecule can be deduced from core-level binding energy shifts. Atomic-orbital composition of molecular orbitals is derived from relative intensities. Correlation peaks yield information about electron correlation. Relaxation energies are related to basicity for certian functional groups. (author)
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Source
25the IUPAC Congress; Jerusalem; 1975; 18 refs.
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Journal Article
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Conference
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Israel Journal of Chemistry; v. 14 p. 124-129
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AbstractAbstract
[en] A survey is given of the development of x-ray and ultraviolet photoelectron spectroscopy. Applications of photoelectron spectroscopy to studies of atomic electronic configurations are discussed, including photoelectron spectra of hydrides isoelectronic with the inert gases; photoelectron spectra of the halogen derivatives of methane; photoelectron spectra of multiple bonded diatomic molecules; spectra and structure of some multiple bonded polyatomic molecules; spectra and structure of triatomic molecules; and methods of orbital assignment of bands in photoelectron spectra. Physical aspects are considered, including intensities; selection rules; dependence of cross section on photoelectron energy; autoionization; angular distribution of photoelectrons; electron-molecule interactions; and transient species. (26 figures, 54 references) (U.S.)
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Journal Article
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Advances in Atomic and Molecular Physics; v. 10 p. 131-171
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Berkowitz, J.
Argonne National Lab., Ill. (USA)1973
Argonne National Lab., Ill. (USA)1973
AbstractAbstract
No abstract available
Primary Subject
Source
1973; 20 p; Chemical spectroscopy and photochemistry in the vacuum ultraviolet conference; Valmorin, Quebeck, Canada; 5 Aug 1973
Record Type
Report
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Conference
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Schillalies, H.; Chatel, J.L.
Electron and ion beam processes applications. 4. International congress AVISEM 74. Toulouse, October 8-11, 19741974
Electron and ion beam processes applications. 4. International congress AVISEM 74. Toulouse, October 8-11, 19741974
AbstractAbstract
[en] Combining a Auger spectrometer with an ESCA spectrometer offers special advantages for materials characterization. Auger spectrum allows a very high sensitivity to be obtained due to a rather strong electronic excitation that allows also the presence of small particulates of foreign substance monolayers at the surface to be displayed. So the Auger procedure is suitable for surface cleanliness verification. The photoelectron (ESCA) spectroscopy ensures a high resolution that allows precise measurements of the chemical changes and search on bands structures. Auger and ESCA measurements are directly compared. Measurements are effected on the same sample and practically at the same time without perturbing the ultra high vacuum. On the way, a direct comparison of both method sensitivity is made possible. The procedure makes also possible the surface cleaning using an ion gun incorporated inside the apparatus, by separating a thin film from the others and simultaneously analyzing the profile
[fr]
La combinaison d'un spectrometre Auger avec un spectrometre ESCA presente des avantages particuliers pour la caracterisation des materiaux. Le spectre Auger permet d'atteindre une sensibilite extremement elevee grace a une excitation par electrons relativement forte qui permet egalement de mettre en evidence sur la surface la presence de petites particules d'une monocouche d'un corps etranger. Le procede Auger convient donc au controle des surfaces propres. Le procede ESCA a, de par son principe, une haute resolution qui permet une mesure precise des modifications chimiques et les recherches sur les structures de bandes. On compare directement les mesures Auger et les mesures ESCA. Les mesures sont effectuees sur le meme echantillon et pratiquement dans un meme temps sans perturbation de l'ultravide. De cette facon, la comparaison directe quantitative de la sensibilite des deux methodes est rendue possible. Le procede donne egalement la possibilite de nettoyer les surfaces a l'aide d'un canon a ions qui est egalement incorpore dans l'appareil en separant des autres une couche mince et en faisant simultanement une analyse de profilOriginal Title
Un spectrometre combine Auger-ESCA pour la caracterisation des materiaux
Secondary Subject
Source
p. 92-100; Oct 1974; Societe Francaise du Vide; Paris, France; 4. International congress AVISEM 74. Application of electronic and ionic processes; Toulouse, France; 08 Oct 1974
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Book
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Conference
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AbstractAbstract
No abstract available
Original Title
Book
Primary Subject
Source
1974; 248 p; John Wiley and Sons, Inc; New York
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Book
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AbstractAbstract
[en] Electron spectroscopy is a well-established technique in physics and chemistry. In particular, its application to chemical analysis is developed to a degree that ESCA instruments are commercially available. The present paper is concerned with the less-popular application of ESCA in solid-state physics. The theoretical background and a number of examples of how this method has been applied in studies of energy bands in metal, alloys and semiconductors are presented. (author)
Source
86 refs., 14 figs; This record replaces 6169700
Record Type
Journal Article
Journal
Atomic Energy Review; ISSN 0004-7112;
; v. 12(4); p. 763-785

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AbstractAbstract
No abstract available
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Journal Article
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Journal of Electron Spectroscopy and Related Phenomena; v. 6(1); p. 81-83
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AbstractAbstract
[en] Crystals of germanium and cadmium telluride have been produced having the characteristics corresponding to the low content of electrically active impurities and crystal defects. The crystals have been grown under conditions of an equilibrium diffusion-concentration interaction of the impurities and crystal defects, with the donor alloying and controlling the acceptors concentration. These crystals have been studied with the help of the mass-spectral analysis, the Hall effect, photoelectroscopy, spectral photoconductivity and losses of collection of a charge from an ionizing particle on gamma-detectors fabricated of the crystals. Herein the doped composition of the crystals has been determined, the concentrations of the shallow and deep acceptors and donors have been measured separately, the life-times of the electrons and holes have been measured, the energetic position and the concentration of the carrier capture levels have been determined. The crystals grown possess all the characteristic features of rather pure crystals. The results of the mass-spectral analysis have shown that in the cadmium telluride crystals the impurities are present within 1014 to 1017 cm-3. Therefore, a deep ''self-refining'' of the crystal takes place, which proceeds by means of deactivation of the electrically active centers with their associating into electrically inactive complexes. Thus a fact of the deep ''self-refining'' of germanium- and cadmium telluride crystals is stated. It is presumed that such a ''self-refining'' can actually proceed practically in all the crystals
Original Title
Yavlenie ''samoochistki'' kristallov
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Secondary Subject
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Journal Article
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Doklady Akademii Nauk SSSR; v. 221(2); p. 325-328
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