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Bateman, R.H.; Bordoli, R.S.; Scott, G.; Green, M.R.
13th International Mass Spectrometry Conference. Book of Abstracts1994
13th International Mass Spectrometry Conference. Book of Abstracts1994
AbstractAbstract
[en] Short communication
Source
[421 p.]; 1994; p. 109; 13. International Mass Spectrometry Conference (IMSC '94); Budapest (Hungary); 29 Aug - 2 Sep 1994
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Miscellaneous
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Conference
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Namyrin, B.A.; Karataev, V.I.; Shmikk, D.V.
AN SSSR, Leningrad. Fiziko-Tekhnicheskij Inst1975
AN SSSR, Leningrad. Fiziko-Tekhnicheskij Inst1975
AbstractAbstract
[en] The description is given of a transit time mass spectrometer comprising an analyser chamber in which a pulse ion source, an ion detector and an ion reflexion system are placed along the same optical axis of the ions. The ion detector and the ion reflexion system are located on two opposite sides in relation to the pulse ion source, the latter being a source of which all the electrodes are transparent to the ions
[fr]
On decrit un spectrometre de masse a temps de parcours comportant une chambre d'analyseur dans laquelle, suivant le meme axe optique des ions, sont places une source d'ions a impulsions, un detecteur d'ions et un systeme de reflexion des ions. Le detecteur d'ions et le systeme de reflexion des ions sont disposes de deux cotes opposes par rapport a la source d'ion a impulsions, cette derniere etant une source dont toutes les electrodes sont transparentes aux ionsOriginal Title
Spectrometre de masse a temps de parcours
Source
8 Oct 1975; 15 p; FR PATENT DOCUMENT 2327638/A/; Available from Institut National de la Propriete Industrielle, Paris (France)
Record Type
Patent
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Glasmachers, A.
Bochum Univ. (Germany, F.R.). Abt. Elektrotechnik1978
Bochum Univ. (Germany, F.R.). Abt. Elektrotechnik1978
AbstractAbstract
[en] In this paper electronic circuits are described for the time measuring channel of a mass spectrometer designed for space applications. In this context the principal aspects of space electronics are described, such as low power consumption, low weight and low volume as well as high reliability. (orig.)
[de]
Diese Arbeit behandelt elektronische Schaltungen fuer den Zeitmesskanal eines Massenspektrometers fuer Weltraumanwendungen. Dabei stellen die allgemeinen Anforderungen an die Weltraumelektronik wie z.B. kleine Leistungsaufnahme, geringes Gewicht und Volumen sowie hohe Zuverlaessigkeit der Schaltungen einen wesentlichen Gesichtspunkt dar. (orig.)Original Title
Elektronische Schaltungen fuer die Kernstrahlungsmesstechnik im Weltraum dargestellt am Zeitmesskanal eines Massenspektrometers
Source
29 Nov 1978; 155 p; Available from Fachinformationszentrum Energie, Physik, Mathematik, Karlsruhe, Germany, F.R; Diss. (D.Eng.).
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Miscellaneous
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Thesis/Dissertation
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Wollnik, H.; Troetscher, J.; Lindenmann, K.
8. International conference on atomic masses and fundamental constants (AMCO-8)1990
8. International conference on atomic masses and fundamental constants (AMCO-8)1990
AbstractAbstract
[en] Abstract only
Primary Subject
Source
Armbruster, P. (Institut Max von Laue - Paul Langevin (ILL), 38 - Grenoble (France)); Barber, R.C. (Winnipeg Univ., MB (Canada). Dept. of Physics); Cohen, E.R. (Rockwell International Corp., Thousand Oaks, CA (United States). Science Center); Institut Max von Laue - Paul Langevin (ILL), 38 - Grenoble (France); Winnipeg Univ., MB (Canada). Dept. of Physics; Rockwell International Corp., Thousand Oaks, CA (United States). Science Center; 129 p; 1990; (ptP) p. 22; 8. international conference on atomic masses and fundamental constants (AMCO-8); Jerusalem (Israel); 9-14 Sep 1990
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AbstractAbstract
No abstract available
Source
1. conference on charged particle optics; Giessen, Germany, F.R; 08 - 11 Sep 1980; Published in summary form only.
Record Type
Journal Article
Literature Type
Conference
Journal
Nuclear Instruments and Methods in Physics Research; v. 187(1); p. 153-156
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Artukh, A.G.; Gridnev, G.F.; Teterev, Yu.G.; Grushezki, M.; Koscielniak, F.; Semchenkov, A.G.; Semichenkova, O.V.; Sereda, Yu.M.; Shchepunov, V.A.; Vishnevskij, I.N.; Severgin, Yu.P.; Lamzin, E.A.; Nagaenko, M.G.; Sytchevski, S.E.
International conference on nuclear physics. Clustering phenomena in nuclear physics. 50. Meeting on nuclear spectroscopy and nuclear structure. Summaries of reports2000
International conference on nuclear physics. Clustering phenomena in nuclear physics. 50. Meeting on nuclear spectroscopy and nuclear structure. Summaries of reports2000
AbstractAbstract
No abstract available
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Source
Rossijskaya Akademiya Nauk, Moscow (Russian Federation); Ministerstvo Atomnoj Ehnergii Rossijskoj Federatsii, Moscow (Russian Federation); Ministerstvo Vysshego i Professional'nogo Obrazovaniya Rossijskoj Federatsii, Moscow (Russian Federation); Sankt-Peterburgskij Gosudarstvennyj Universitet, Sankt-Peterburg (Russian Federation); Peterburgskij Institut Yadernoj Fiziki im. B.P. Konstantinova RAN, Gatchina (Russian Federation); Radievyj Institut im. V.G. Khlopina, Sankt-Peterburg (Russian Federation); 566 p; ISBN 586-763-024-2;
; 2000; p. 370; International conference on nuclear physics. Clustering phenomena in nuclear physics. 50. Meeting on nuclear spectroscopy and nuclear structure; Sankt-Petersburg (Russian Federation); 14-17 Jun 2000; 1 ref.

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Book
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AbstractAbstract
[en] We have modeled, designed, built, and tested a novel reflectron time-of-flight (TOF) analyzer, which is capable of performing surface analysis using both secondary ion mass spectroscopy (SIMS) and mass spectroscopy of recoiled ions (MSRI). All elements (including H and He) can be identified, with isotopic resolution, using both MSRI and SIMS. For ions of a given mass, the higher energy ions penetrate further into the reflectron before being turned around while the lower energy ions do not penetrate as deeply. By properly adjusting both the experimental geometry and the reflectron voltages, all ions of a given mass arrive at the detector simultaneously resulting in enhanced mass resolution compared with simple TOF detection. SIM spectra are complicated by molecular fragments in addition to elemental ions. In MSRI only elemental ions are detected. As a result, data analysis in MSRI is less complicated than in SIMS. Being able to use a single analyzer to selectively obtain SIMS or MSRI data provides complementary surface information. MSRI has a number of unique capabilities for surface studies. In situ, real-time surface analysis can be performed during film growth at pressures of ∼2.5 mTorr at the substrate by differentially pumping both the ion source and the reflectron analyzer region. It has been demonstrated that the ratio of the positive to negative ion yield is phase specific; for example, one can clearly distinguish the different forms of carbon (diamond versus graphite versus amorphous carbon) during film growth. MSRI analysis of poorly conducting surfaces is possible. copyright 1999 American Vacuum Society
Record Type
Journal Article
Journal
Journal of Vacuum Science and Technology. A, Vacuum, Surfaces and Films; ISSN 0734-2101;
; CODEN JVTAD6; v. 17(5); p. 2634-2641

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AbstractAbstract
[en] Combination of Three Dimensional Quadrupole Ion Trap and Time Of Flight Mass Spectrometer is very interesting because they both rely on time though in a different manner. The 3DQIT can accumulate many ions of which the desired ions can be selected and kept for a very long period of time. Ions can subsequently be extracted in a short burst from the 3DQIT to be sent in a TOFMS. This process can be eased if the trapped ions are cooled by collisions with gas molecules inside the trap. We will discuss from the basic principles of physics what are the best conditions leading the maximum number of usable ions to penetrate in the TOFMS while keeping the resolving power at an acceptable level
Primary Subject
Source
S0168900298015307; Copyright (c) 1999 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: Portugal
Record Type
Journal Article
Journal
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment; ISSN 0168-9002;
; CODEN NIMAER; v. 427(1-2); p. 141-144

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AbstractAbstract
[en] The ORNL Atom Probe is a microanalytical tool for studies in materials science. The instrument is a combination of a customized version of the vacuum system of the VG FIM-100 atom probe, an ORNL-designed microcomputer-controlled digital timing system, and a double curved CEMA Imaging Atom Probe detector. The atom probe combines four instruments into one - namely a field ion microscope, an energy compensated time-of-flight mass spectrometer, an imaging atom probe, and a pulsed laser atom probe
Source
32. International field emission symposium; Wheeling, WV (USA); 14-19 Jul 1986
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Journal Article
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AbstractAbstract
[en] A method for electrically adjusting an ion beam in an MSKh-4 mass-spectrometer has been developed. The adjusting system consists of two deflecting plates fastened to the frame of the ion source. By adjusting the potential difference at the plates in the range 0-150 v, one can increase the intensity of the mass-spectrum by a factor of 3 to 5
Original Title
Yustirovka ionnogo puchka v mass-spektrometre MSKh-4
Source
For English translation see the journal Instrum. Exp. Tech.
Record Type
Journal Article
Journal
Pribory i Tekhnika Ehksperimenta; (no.1); p. 273
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